The microstructure of ceramic materials can now be observed directly at the atomic level by using high-resolution electron microscopy. These techniques are described in detail, and the type of new information that they are revealing about the structure of ceramics is illustrated with examples drawn from investigations of hot-pressed silicon nitrides, sintered silicon carbide, and a ''Sialon'' system. 15 figures
<p>This chapter reviews recent developments in the microstructural characterization of hard ceramics...
Grain boundaries in silicon-based ceramics have been characterized by high resolution electron micro...
Recent results of high-resolution electron microscopy on Si_3N_4 and SiC are presented and reviewed....
High-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruct...
The development and potential utilization of ceramic materials is dependent on a systematic effort i...
High-resolution transmission electron microscopy is utilized to examine the crystal structure of a s...
The thin intergranular phase in a silicon nitride (Si3N4)ceramic, which has been regarded for decade...
The microstructure of various ceramic materials was investigated using scanning at. force microscopy...
The thin intergranular phase in a silicon nitride (Si3N4) ceramic, which has been regarded for deca...
The bulk properties of a large range of materials are controlled by the atomic structure and chemist...
Résumé. 2014 La microscopie électronique en transmission à haute résolution a été utilisée pour l’ét...
In the last few years, the scanning transmission electron microscope has become capable of forming e...
L'efficience de la microscopie électronique à haute résolution et à haute tension pour la recherche ...
This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. I...
Abstract — The arrangement of ions and grain boundary structures in ceramics have been made clearer ...
<p>This chapter reviews recent developments in the microstructural characterization of hard ceramics...
Grain boundaries in silicon-based ceramics have been characterized by high resolution electron micro...
Recent results of high-resolution electron microscopy on Si_3N_4 and SiC are presented and reviewed....
High-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruct...
The development and potential utilization of ceramic materials is dependent on a systematic effort i...
High-resolution transmission electron microscopy is utilized to examine the crystal structure of a s...
The thin intergranular phase in a silicon nitride (Si3N4)ceramic, which has been regarded for decade...
The microstructure of various ceramic materials was investigated using scanning at. force microscopy...
The thin intergranular phase in a silicon nitride (Si3N4) ceramic, which has been regarded for deca...
The bulk properties of a large range of materials are controlled by the atomic structure and chemist...
Résumé. 2014 La microscopie électronique en transmission à haute résolution a été utilisée pour l’ét...
In the last few years, the scanning transmission electron microscope has become capable of forming e...
L'efficience de la microscopie électronique à haute résolution et à haute tension pour la recherche ...
This chapter briefly describes the fundamentals of high-resolution electron microscopy techniques. I...
Abstract — The arrangement of ions and grain boundary structures in ceramics have been made clearer ...
<p>This chapter reviews recent developments in the microstructural characterization of hard ceramics...
Grain boundaries in silicon-based ceramics have been characterized by high resolution electron micro...
Recent results of high-resolution electron microscopy on Si_3N_4 and SiC are presented and reviewed....