Defects in metal crystals. Progress report, May 1, 1973--April 30, 1974

Progress was made in the following areas: FIM (field ion microscopy) studies of defects in W irradiated with W ions or electrons; FIM studies of Au irradiated with Au or Xe ions; FIM and electrical resistivity study of vacancy defects in quenched W; FIM studies of dilute Pt alloys; measurement of the range of focused replacement sequences in Au; investigation of grain boundary strtucture (using Au); FIM observation of dissociated screw dislocations in Mo; calculation of properties of point defects in metals; and atom probe FIM. (auth