Method of inspecting dielectric materials at microwave frequencies

A successful method of screening high-dielectric-constant, nonmagnetic, high-loss-factor materials at microwave frequencies was developed to provide material control by incoming inspection. This is accomplished by measuring the S parameters of the material---reliance on the manufacturer's permittivity data and x-ray examination for voids and inclusions is no longer necessary. Use of an automatic network analyzer makes 100% inspection economically feasible. (auth