The identification of crystalline phases in solids requires knowledge of two microstructural properties: crystallographic structure and chemical composition. Traditionally, this has been accomplished using X-ray diffraction techniques where the measured crystallographic information, in combination with separate chemical composition measurements for specimens of unknown pedigrees, is used to deduce the unknown phases. With the latest microstructural analysis tools for scanning electron microscopes, both the crystallography and composition can be determined in a single analysis utilizing electron backscatter diffraction and energy dispersive spectroscopy, respectively. In this chapter, we discuss the approach required to perform these experim...
The application of electron diffraction to crystallographically characterize all kinds of materials ...
Scanning electron microscopy is widespread in field of material science and research, especially bec...
The three scanning electron microscope diffraction based techniques of electron channelling patterns...
Recently, an electron backscatter diffraction (EBSD) system was developed that uses a 1024 1024 CCD...
ABSTRACT ws~l EBSD in the SEM has been developed into a tool that can provide identification of unkn...
EBSD in the SEM has been developed into a tool that can provide identification of unknown crystallin...
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction ...
Since the development of electron backscattering diffraction (EBSD), scanning electron microscopy (S...
615 ref. biblioInternational audienceThe application of the electron backscatter diffraction techniq...
It is well known that orientations of grains and microstructure of grain boundaries in advanced cera...
Microstructure characterisation has been greatly enhanced through the use of electron backscatter di...
The purpose of this article is to present a practical guide to the identification of phases in the a...
This paper describes the use of backscattered electron Kikuchi patterns (BEKP) for phase identificat...
Information for phase identification may be gathered in the electron transmission microscope with sp...
International audienceThis paper first underlines the main advantages, use and limitations of the el...
The application of electron diffraction to crystallographically characterize all kinds of materials ...
Scanning electron microscopy is widespread in field of material science and research, especially bec...
The three scanning electron microscope diffraction based techniques of electron channelling patterns...
Recently, an electron backscatter diffraction (EBSD) system was developed that uses a 1024 1024 CCD...
ABSTRACT ws~l EBSD in the SEM has been developed into a tool that can provide identification of unkn...
EBSD in the SEM has been developed into a tool that can provide identification of unknown crystallin...
Electron Back-Scatter Diffraction (EBSD) is a powerful technique that captures electron diffraction ...
Since the development of electron backscattering diffraction (EBSD), scanning electron microscopy (S...
615 ref. biblioInternational audienceThe application of the electron backscatter diffraction techniq...
It is well known that orientations of grains and microstructure of grain boundaries in advanced cera...
Microstructure characterisation has been greatly enhanced through the use of electron backscatter di...
The purpose of this article is to present a practical guide to the identification of phases in the a...
This paper describes the use of backscattered electron Kikuchi patterns (BEKP) for phase identificat...
Information for phase identification may be gathered in the electron transmission microscope with sp...
International audienceThis paper first underlines the main advantages, use and limitations of the el...
The application of electron diffraction to crystallographically characterize all kinds of materials ...
Scanning electron microscopy is widespread in field of material science and research, especially bec...
The three scanning electron microscope diffraction based techniques of electron channelling patterns...