A low-budget surface slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was recently brought into operation at the Advanced Light Source Optical Metrology Laboratory [Nucl. Instr. and Meth. A 616, 212-223 (2010)]. The instrument is based on a precisely calibrated autocollimator and a movable pentaprism. The capability of the DLTP to achieve sub-microradian surface slope metrology has been verified via cross-comparison measurements with other high-performance slope measuring instruments when measuring the same high-quality test optics. In the present work, a further improvement of the DLTP is achieved by replacing the existing bulk pentaprism with a specially designed mirror based pentaprism. A mirror based pentaprism ...
The PSS (pentaprism scanning system) has advantages of simple structure, needless of reference flat,...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
A low-budget surface slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was r...
In the recent work [Proc. of SPIE 7801, 7801-2/1-12 (2010), Opt. Eng. 50(5) (2011), in press], we ha...
The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measur...
The autocollimator and moveable pentaprism based DLTP [NIM A 616 (2010) 212-223], a low-budget, NOM-...
A new low budget slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was recen...
Performance of state-of-the-art surface slope measuring profilers, such as the Advanced Light Source...
The Long Trace Profiler (LTP) is in use at many synchrotron radiation (SR) laboratories throughout t...
The Long Trace Profiler (LTP) is in use at several synchrotron radiation (SR) laboratories throughou...
The Long Trace Profiler (LTP), an instrument for measuring the slope profile of long X-ray mirrors, ...
A simple device composed of a modular double-pentaprism system that enables the long trace profiler ...
Systematic error and instrumental drift are the major limiting factors of sub-microradian slope metr...
Systematic error and instrumental drift are the major limiting factors of sub-microradian slope metr...
The PSS (pentaprism scanning system) has advantages of simple structure, needless of reference flat,...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...
A low-budget surface slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was r...
In the recent work [Proc. of SPIE 7801, 7801-2/1-12 (2010), Opt. Eng. 50(5) (2011), in press], we ha...
The Long Trace Profiler (LTP) is in use at a number of locations throughout the world for the measur...
The autocollimator and moveable pentaprism based DLTP [NIM A 616 (2010) 212-223], a low-budget, NOM-...
A new low budget slope measuring instrument, the Developmental Long Trace Profiler (DLTP), was recen...
Performance of state-of-the-art surface slope measuring profilers, such as the Advanced Light Source...
The Long Trace Profiler (LTP) is in use at many synchrotron radiation (SR) laboratories throughout t...
The Long Trace Profiler (LTP) is in use at several synchrotron radiation (SR) laboratories throughou...
The Long Trace Profiler (LTP), an instrument for measuring the slope profile of long X-ray mirrors, ...
A simple device composed of a modular double-pentaprism system that enables the long trace profiler ...
Systematic error and instrumental drift are the major limiting factors of sub-microradian slope metr...
Systematic error and instrumental drift are the major limiting factors of sub-microradian slope metr...
The PSS (pentaprism scanning system) has advantages of simple structure, needless of reference flat,...
The ultimate performance of surface slope metrology instrumentation, such as long trace profilers an...
The effective utilization of synchrotron radiation (SR) from high-brightness sources requires the us...