We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry. The key novel development is the fault-secure detector (FSD) error-correcting code (ECC) definition and associated circuitry that can detect errors in the received encoded vector despite experiencing multiple transient faults in its circuitry. The structure of the detector is general enough that it can be used for any ECC that follows our FSD-ECC definition. We prove that two known classes of Low-Density Parity-Check Codes have the FSD-ECC property: Euclidean Geometry and Projective Geometry codes. We identify a specific FSD-LDPC code that can tolerate up to 33 e...
become more common and affect a larger number of cells. In order to guard memories alongside of MCUs...
In this paper, a technique was proposed to protect memory cells, which are more susceptible to soft ...
Abstract- Fault is one of the most challenging problems of VLSI testing. In any system, Single piece...
Memory cells have been protected from soft errors for more than a decade; due to the increase in sof...
There has been a rising demand for well-organized and reliable digital storage as well as transmissi...
Includes bibliographical references (leaf 24)The Project is based on the study of NanoMemory structu...
The paper aims to propose as elementary work on a reliable memory system that can tolerate multiple ...
We introduce a nanowire-based, sublithographic memory ar-chitecture tolerant to transient faults. Bo...
Abstract — Majority logic decodable codes are suitable for memory applications because of their capa...
Abstract- Error detection in memory applications was proposed to accelerate the majority logic decod...
In this letter, we investigate fault-tolerance of memories built from unreliable cells. In order to ...
This paper presents an error-detection method for Euclidean Geometry low density parity check codes ...
In this paper, we present an in-depth analysis of transient behavior, mainly glitches, in the parall...
Memories are one of the most critical components of many systems: due to exposure to energetic part...
The exponential growth of digital data has led to the proliferation of cloud storage systems as well...
become more common and affect a larger number of cells. In order to guard memories alongside of MCUs...
In this paper, a technique was proposed to protect memory cells, which are more susceptible to soft ...
Abstract- Fault is one of the most challenging problems of VLSI testing. In any system, Single piece...
Memory cells have been protected from soft errors for more than a decade; due to the increase in sof...
There has been a rising demand for well-organized and reliable digital storage as well as transmissi...
Includes bibliographical references (leaf 24)The Project is based on the study of NanoMemory structu...
The paper aims to propose as elementary work on a reliable memory system that can tolerate multiple ...
We introduce a nanowire-based, sublithographic memory ar-chitecture tolerant to transient faults. Bo...
Abstract — Majority logic decodable codes are suitable for memory applications because of their capa...
Abstract- Error detection in memory applications was proposed to accelerate the majority logic decod...
In this letter, we investigate fault-tolerance of memories built from unreliable cells. In order to ...
This paper presents an error-detection method for Euclidean Geometry low density parity check codes ...
In this paper, we present an in-depth analysis of transient behavior, mainly glitches, in the parall...
Memories are one of the most critical components of many systems: due to exposure to energetic part...
The exponential growth of digital data has led to the proliferation of cloud storage systems as well...
become more common and affect a larger number of cells. In order to guard memories alongside of MCUs...
In this paper, a technique was proposed to protect memory cells, which are more susceptible to soft ...
Abstract- Fault is one of the most challenging problems of VLSI testing. In any system, Single piece...