Various error models are being used in simulation of voltage-scaled arithmetic units to examine application-level tolerance of timing violations. The selection of an error model needs further consideration, as differences in error models drastically affect the performance of the application. Specifically, floating point arithmetic units (FPUs) have architectural characteristics that characterize its behavior. We examine the architecture of FPUs and design a new error model, which we call Critical Bit. We run selected benchmark applications with Critical Bit and other widely used error injection models to demonstrate the differences
Artificial Intelligence (AI) hardware accelerators have seen tremendous developments in recent years...
Embedded applications can often demand stringent latency requirements. While high degrees of paralle...
Li, XiaomingAs technology scales, VLSI performance has experienced an exponential growth. As feature...
Circuit designers typically combat variations in hardware and workload by increasing conservative gu...
International audienceVoltage scaling has been used as a prominent technique to improve energy effic...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
Low-power consumption has become an important aspect of processors and systems design. Many techniqu...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
International audienceVarious methods have been proposed for fault detection and fault tolerance in...
Timing errors that are caused by the timing violations of sensitized circuit paths, have emerged as ...
This paper proposes a novel approach to modeling of gate level timing errors during high-level instr...
Timing errors that are caused by the timing violations of sensitized circuit paths, have emerged as ...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
We present a rigorous empirical study of the bit-level error behavior of field programmable gate arr...
Artificial Intelligence (AI) hardware accelerators have seen tremendous developments in recent years...
Embedded applications can often demand stringent latency requirements. While high degrees of paralle...
Li, XiaomingAs technology scales, VLSI performance has experienced an exponential growth. As feature...
Circuit designers typically combat variations in hardware and workload by increasing conservative gu...
International audienceVoltage scaling has been used as a prominent technique to improve energy effic...
Abstract — Deeply scaled CMOS circuits are increasingly sus-ceptible to transient faults and soft er...
Low-power consumption has become an important aspect of processors and systems design. Many techniqu...
Microelectronic scaling has entered into the nanoscale era with tremendous capacity and performance ...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
International audienceVarious methods have been proposed for fault detection and fault tolerance in...
Timing errors that are caused by the timing violations of sensitized circuit paths, have emerged as ...
This paper proposes a novel approach to modeling of gate level timing errors during high-level instr...
Timing errors that are caused by the timing violations of sensitized circuit paths, have emerged as ...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
We present a rigorous empirical study of the bit-level error behavior of field programmable gate arr...
Artificial Intelligence (AI) hardware accelerators have seen tremendous developments in recent years...
Embedded applications can often demand stringent latency requirements. While high degrees of paralle...
Li, XiaomingAs technology scales, VLSI performance has experienced an exponential growth. As feature...