As signaling rates increase, the usable bandwidth of modern telecommunication and storage systems is bounded by parasitic elements within the signal path. To improve data throughput, system designers use cascaded combinations of equivalent circuit models obtained through component level simulation and measurement to evaluate the communications channel. The analytical methods used to create these models have frequency dependent limitations and restrict applications. To this end, a measurement based comparison of quasi-static and full-wave simulation methodologies was performed on plated through hole via structures in a printed circuit board over a frequency range of 0.1GHz to 20GHz. Test fixtures and calibration standards, which isolate the ...
The via-plate capacitance for a via transition to a multilayer printed circuit board is evaluated an...
In this paper, a novel de-embedding methodology is proposed for through silicon via (TSV) characteri...
A quasi-static equivalent circuit model of a dumbbell shaped defected ground structure (DGS) is deve...
The EMC and signal integrity impact of printed circuit board (PCB) trace discontinuities, such as vi...
This paper introduces an approach of using a plated through-hole (PTH) via transmission-line model i...
This paper introduces an approach of using a plated through-hole (PTH) via transmission-line model i...
Aim of this paper is the validation in both frequency and time domain of the procedure to extract fu...
Plated through-hole (PTH) vias are commonly used in printed circuit boards. They usually leave open ...
In order to efficiently design multilayered chip packages and boards for RF/high-speed applications,...
The development of modern digital communication systems has been entered a new era with faster signa...
A 26-layer printed circuit board including several test sites has been analyzed. All the sites have ...
This work presents a study to build lumped models for fault-free and faulty Through Silicon Vias (TS...
This work presents a study to build lumped models for fault-free and faulty Through Silicon Vias (TS...
In this paper, the electrical characteristics of through-silicon hole (TSH) structures are investiga...
This work presents a study to build lumped models for fault-free and faulty Through Silicon Vias (TS...
The via-plate capacitance for a via transition to a multilayer printed circuit board is evaluated an...
In this paper, a novel de-embedding methodology is proposed for through silicon via (TSV) characteri...
A quasi-static equivalent circuit model of a dumbbell shaped defected ground structure (DGS) is deve...
The EMC and signal integrity impact of printed circuit board (PCB) trace discontinuities, such as vi...
This paper introduces an approach of using a plated through-hole (PTH) via transmission-line model i...
This paper introduces an approach of using a plated through-hole (PTH) via transmission-line model i...
Aim of this paper is the validation in both frequency and time domain of the procedure to extract fu...
Plated through-hole (PTH) vias are commonly used in printed circuit boards. They usually leave open ...
In order to efficiently design multilayered chip packages and boards for RF/high-speed applications,...
The development of modern digital communication systems has been entered a new era with faster signa...
A 26-layer printed circuit board including several test sites has been analyzed. All the sites have ...
This work presents a study to build lumped models for fault-free and faulty Through Silicon Vias (TS...
This work presents a study to build lumped models for fault-free and faulty Through Silicon Vias (TS...
In this paper, the electrical characteristics of through-silicon hole (TSH) structures are investiga...
This work presents a study to build lumped models for fault-free and faulty Through Silicon Vias (TS...
The via-plate capacitance for a via transition to a multilayer printed circuit board is evaluated an...
In this paper, a novel de-embedding methodology is proposed for through silicon via (TSV) characteri...
A quasi-static equivalent circuit model of a dumbbell shaped defected ground structure (DGS) is deve...