Scope and Method of Study: Wave pipeline is one of the revolutionary technologies beyond conventional pipeline in the microprocessor architecture research area. Clockless wave pipeline is the cutting-edge and innovative pipeline without relying on clock signal. Due to the stringent requirement for high density and performance of current VLSI technology, reliability is being considered as one of the most crucial issues. Reliability modeling and optimization techniques have been applied extensively. Clock frequency is one of the keys to achieve the fast circuit speed. A clock cycle time optimization and analysis method is proposed in order to achieve a ultra high clock frequency in the context of the proposed new wave pipeline.Findings and Co...
High performance digital systems make extensive use of pipelines. Three years ago, "surfing" pipeli...
Abstract—Every new VLSI technology generation has resulted in interconnects increasingly limiting th...
A reliability simulator for traditional gate oxide time dependent dielectric breakdown (TDDB) and th...
Includes bibliographic references (leaves 39-41)Thesis (M.S.)--Wichita State University, Dept. of El...
This paper presents a model for analyzing the reliability of a clockless wave pipeline as an intelle...
Aggressive design using level-sensitive latches and wave pipelining has been proposed to meet the in...
Pipeline architectures are often considered in VLSI designs that require high throughput. The draw-b...
The Gigahertz clock rates in today's VLSI systems are not only due to advances in technology but tha...
The use of level-sensitive latches and wave-pipelining techniques are two aggressive methods to incr...
High throughput and low latency designs are required in modern high performance systems, especially ...
In this paper, a new high speed control circuit is proposed which will act as a critical path for th...
In all of the previous pipelining methods such as conventional pipelining, wave pipelining, and meso...
Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses...
In conventional pipelined designs one set of signals is allowed to propagate between sets of flipflo...
Journal ArticleThis paper describes a new technique for integrating asynchronous modules within CI h...
High performance digital systems make extensive use of pipelines. Three years ago, "surfing" pipeli...
Abstract—Every new VLSI technology generation has resulted in interconnects increasingly limiting th...
A reliability simulator for traditional gate oxide time dependent dielectric breakdown (TDDB) and th...
Includes bibliographic references (leaves 39-41)Thesis (M.S.)--Wichita State University, Dept. of El...
This paper presents a model for analyzing the reliability of a clockless wave pipeline as an intelle...
Aggressive design using level-sensitive latches and wave pipelining has been proposed to meet the in...
Pipeline architectures are often considered in VLSI designs that require high throughput. The draw-b...
The Gigahertz clock rates in today's VLSI systems are not only due to advances in technology but tha...
The use of level-sensitive latches and wave-pipelining techniques are two aggressive methods to incr...
High throughput and low latency designs are required in modern high performance systems, especially ...
In this paper, a new high speed control circuit is proposed which will act as a critical path for th...
In all of the previous pipelining methods such as conventional pipelining, wave pipelining, and meso...
Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses...
In conventional pipelined designs one set of signals is allowed to propagate between sets of flipflo...
Journal ArticleThis paper describes a new technique for integrating asynchronous modules within CI h...
High performance digital systems make extensive use of pipelines. Three years ago, "surfing" pipeli...
Abstract—Every new VLSI technology generation has resulted in interconnects increasingly limiting th...
A reliability simulator for traditional gate oxide time dependent dielectric breakdown (TDDB) and th...