Add to ORKGDesign modifications in microprocessors are recommended to simplify the task of testing them in the user's environment. The recommended design modifications are two additional instructions that can easily be incorporated into the architecture of any currently manufactured microprocessor. A test method is then given that makes use of these instructions and also utilizes some of the principles of Thatte and Abraham (given in their recently published paper). It is shown that the present test method is an improvement over the test method of Thatte and Abraham in at least three ways: the test generation procedures are simpler to use, the fault model allows the existence of larger number of faults, and the testing time is reduced significantly. T...
The microchip, an ultra-small and fragile electrical system is prone to damage either during the fab...
Test generation is an important part of a circuit as the test vectors are used during the design, ma...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in...
ISBN: 0852962894A test method based upon the external description of microprocessors is proposed. Th...
All microprocessor units have a similar architecture from which a basic test philosophy can be adopt...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach...
The gate-level testing also called low-level testing is generally appropriate at the design time and...
It is important to check whether the manufactured circuit has physical defects or not. Else, the def...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
This paper addresses test generation for design verification of pipelined microprocessors. We descri...
This chapter describes and analyzes a methodology for gathering together test-programs for microproc...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
HARDWARE TESTING is commonly used to check whether faults exist in a digital system. Much research h...
The microchip, an ultra-small and fragile electrical system is prone to damage either during the fab...
Test generation is an important part of a circuit as the test vectors are used during the design, ma...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in...
ISBN: 0852962894A test method based upon the external description of microprocessors is proposed. Th...
All microprocessor units have a similar architecture from which a basic test philosophy can be adopt...
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach...
The gate-level testing also called low-level testing is generally appropriate at the design time and...
It is important to check whether the manufactured circuit has physical defects or not. Else, the def...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
This paper addresses test generation for design verification of pipelined microprocessors. We descri...
This chapter describes and analyzes a methodology for gathering together test-programs for microproc...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
HARDWARE TESTING is commonly used to check whether faults exist in a digital system. Much research h...
The microchip, an ultra-small and fragile electrical system is prone to damage either during the fab...
Test generation is an important part of a circuit as the test vectors are used during the design, ma...
The ever increasing usage of microprocessor devices is sustained by a high volume production that in...