Low energy SIMS has been used to determine range distributions of boron in amorphous and crystalline silicon in the energy regions 1-40 keV and 5-10 keV, respectively. Up to 20 keV the range distributions of 10B and 11B in amorphous silicon are identical. A small isotope effect is seen at 40 keV. Comparison with previously reported SIMS data at energies E{slanted equal to or greater-than}30 keV shows excellent agreement. Calculated ranges for E{slanted equal to or greater-than}10 keV are smaller by up to 20% (at 10 keV). Channeled range distributions in Si(100) support the assumption of velocity proportional electronic stopping, the respective cross section being in good agreement with a previously reported number determined at energies abo...
We present new results on the channeling of B ions in Si crystals. Standard surface barrier detector...
Boron, as the main p-type dopant in Si, has been extensively investigated both experimentally and th...
In order to calculate the redistribution of boron in silicon by both diffusion and autodoping during...
Ranges of boron isotopes with masses 10 and 11 were measured in silicon for implantation energies of...
Boron and phosphorus were implanted in p-type and n-type silicon wafers in the energy range from 0.1...
Range profiles of boron in amorphous silicon exhibit pronounced deviations from Gaussian at energies...
Profiles of boron implants into the (100) direction of silicon and the range straggling for `B were ...
Channeling boron implants were performed into (100) and (110) silicon substrates in the energy range...
Redistribution during annealing of low-energy boron (B) implants in silicon on insulator (SOI) struc...
An ultra high vacuum, low energy ion implanter was used in conjunction with a range of analytical te...
Boron ions in the 15-50 MeV energy range were implanted into high resistivity silicon targets. The ...
There is a great need to quantify sub-ppm levels of boron in bulk silicon. There are several methods...
International audienceThe redistribution of boron in highly implanted 〈1 0 0〉 silicon (10 keV; 5×101...
Boron ions were implanted into high resistivity Si wafers at energies in the 15-50 MeV range and dos...
The redistribution during annealing of low-energy B implants in SOI structures and in bulk Si have b...
We present new results on the channeling of B ions in Si crystals. Standard surface barrier detector...
Boron, as the main p-type dopant in Si, has been extensively investigated both experimentally and th...
In order to calculate the redistribution of boron in silicon by both diffusion and autodoping during...
Ranges of boron isotopes with masses 10 and 11 were measured in silicon for implantation energies of...
Boron and phosphorus were implanted in p-type and n-type silicon wafers in the energy range from 0.1...
Range profiles of boron in amorphous silicon exhibit pronounced deviations from Gaussian at energies...
Profiles of boron implants into the (100) direction of silicon and the range straggling for `B were ...
Channeling boron implants were performed into (100) and (110) silicon substrates in the energy range...
Redistribution during annealing of low-energy boron (B) implants in silicon on insulator (SOI) struc...
An ultra high vacuum, low energy ion implanter was used in conjunction with a range of analytical te...
Boron ions in the 15-50 MeV energy range were implanted into high resistivity silicon targets. The ...
There is a great need to quantify sub-ppm levels of boron in bulk silicon. There are several methods...
International audienceThe redistribution of boron in highly implanted 〈1 0 0〉 silicon (10 keV; 5×101...
Boron ions were implanted into high resistivity Si wafers at energies in the 15-50 MeV range and dos...
The redistribution during annealing of low-energy B implants in SOI structures and in bulk Si have b...
We present new results on the channeling of B ions in Si crystals. Standard surface barrier detector...
Boron, as the main p-type dopant in Si, has been extensively investigated both experimentally and th...
In order to calculate the redistribution of boron in silicon by both diffusion and autodoping during...