Add to ORKGGrazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-ray Scattering (GIXS) is used to probe the internal structure of thin films on solid or liquid substrates. Time 3:52.https://repository.upenn.edu/xray_scattering_interfaces/1002/thumbnail.jp
In this method, the incident beam is totally externally reflected from a surface or substrate, follo...
An in-house grazing incidence X-ray scattering (GIXS) apparatus has been newly built for studying a ...
Small-angle X-ray scattering (SAXS) is generally not applicable to thin (∼1 µm) films and...
Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-r...
A non-destructive characterization of the structure in nanostructured thin films and multilayers is ...
Mesoscopic structures on length scales of 10 nm to 1000 nm are of high interest for the study of nan...
The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) d...
X-ray diffraction represents the classical method for determining the crystalline structure of solid...
We demonstrate a diffraction geometry which provides strong sensitivity to the microstructure of thi...
With the advent of third-generation synchrotron sources and the development of fast two-dimensional ...
Grazing incidence small angle x-ray scattering (GISAXS) is a powerful technique for morphology inves...
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using a...
In this article we discuss the applicability of global scattering functions for structure analysis ...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
Using existing double axis resolution x-ray diffractometer, the grazing incidence reflectivity is st...
In this method, the incident beam is totally externally reflected from a surface or substrate, follo...
An in-house grazing incidence X-ray scattering (GIXS) apparatus has been newly built for studying a ...
Small-angle X-ray scattering (SAXS) is generally not applicable to thin (∼1 µm) films and...
Grazing incidence scattering, sometimes Grazing Incidence Diffraction (GID) or Grazing Incidence X-r...
A non-destructive characterization of the structure in nanostructured thin films and multilayers is ...
Mesoscopic structures on length scales of 10 nm to 1000 nm are of high interest for the study of nan...
The multiple scattering effects present in grazing-incidence small-angle X-ray scattering (GISAXS) d...
X-ray diffraction represents the classical method for determining the crystalline structure of solid...
We demonstrate a diffraction geometry which provides strong sensitivity to the microstructure of thi...
With the advent of third-generation synchrotron sources and the development of fast two-dimensional ...
Grazing incidence small angle x-ray scattering (GISAXS) is a powerful technique for morphology inves...
Dynamical scattering effects are observed in grazing-incidence X-ray diffraction experiments using a...
In this article we discuss the applicability of global scattering functions for structure analysis ...
The complex nano-morphology of modern soft-matter materials is successfully probed with advanced gra...
Using existing double axis resolution x-ray diffractometer, the grazing incidence reflectivity is st...
In this method, the incident beam is totally externally reflected from a surface or substrate, follo...
An in-house grazing incidence X-ray scattering (GIXS) apparatus has been newly built for studying a ...
Small-angle X-ray scattering (SAXS) is generally not applicable to thin (∼1 µm) films and...