We investigate dynamic voltage and frequency scaling (DVFS) as a mechanism for dynamic reliability management (DRM) of chip multiprocessors (CMPs). The proposed DRM scheme operates as a control technique whose objective is to drive the operation of the CMP such that reliability changes towards a desired target. While the chip multiprocessor is continuously monitored and reliability is estimated in real time, the voltage and frequency of different cores in the CMP are dynamically adjusted such that reliability converges towards the target. When the temperature of cores increases and thus reliability degrades, the proposed DRM scheme throttles selectively the frequency of the cores with the highest temperature. This is turn, leads to a lower ...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
We propose and evaluate two new and independently-applicable techniques, process-driven voltage scal...
Abstract—We investigate dynamic voltage and frequency scal-ing (DVFS) as a mechanism for dynamic rel...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Reliability failure mechanisms, such as time dependent dielectric e breakdown, electromigration, and...
Fine-grained dynamic voltage/frequency scaling (DVFS) demonstrates great promise for improving the e...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Abstract—High-performance processors are becoming increasingly power bound with technology scaling. ...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
We propose and evaluate two new and independently-applicable techniques, process-driven voltage scal...
Abstract—We investigate dynamic voltage and frequency scal-ing (DVFS) as a mechanism for dynamic rel...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Dynamic Reliability Management (DRM) is a common approach to mitigate aging and wear-out effects in ...
Reliability failure mechanisms, such as time dependent dielectric e breakdown, electromigration, and...
Fine-grained dynamic voltage/frequency scaling (DVFS) demonstrates great promise for improving the e...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Long-term reliability of processors in embedded systems is experiencing growing attention since decr...
Abstract—High-performance processors are becoming increasingly power bound with technology scaling. ...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
Reliability is a major concern for nanoscale CMOS circuits. Degradation phenomena such as Electromig...
We propose and evaluate two new and independently-applicable techniques, process-driven voltage scal...