Yield Monitoring and Mapping

The monitoring and mapping of yield variations have captured the interest of many producers. The ability to monitor grain yield on-the-go and map the in-field variations for use in management decisions has come from a dream to near-reality. The paper and presentation will discuss the recent past, the present, and the near future of crop yield monitoring and mapping. An attempt to provide accurate, correct, and current information was made. However, some information may have changed and may be outdated. This paper is not an endorsement of the products or technologies