Confined Photonic Mode Propagation Observed in Photoemission Electron Microscopy

Using photoemission electron microscopy (PEEM) we present a comparative analysis of the wavelength dependence of propagating fields in a simple optical slab waveguide and a thin film photonic crystal W1-type waveguide. We utilize an interferometric imaging approach for light in the near-ultraviolet regime where a 2-photon process is required to produce photoelectron emission. The typical spatial resolution in these experiments is \u3c 30 nm. Electromagnetic theory and finite element simulations are shown to be in good agreement with the experimental observations. Our results indicate that multiphoton PEEM is a useful sub-wavelength characterization technique in thin film optics