Possible Correction of Preferential Orientation of Crystallites in Quantitative X-ray Determination by Means of Basal Reflections

In a previously published work1 we have described a method by which the intensity of an X-ray reflection that has been strengthened by preferential crystallite orientation can be corrected by measuring its ratio to the intensity of a reflection that is weakened by the same effect. In this way the intensity can be corrected to that given by a sample with a selected define degree of preferential orientation and then applied in quantitative analysis