Cantilever arrays offer a promising alternative to standard single cantilever atomic force microscopy (AFM) imaging techniques. The successful implementation and operation of such an AFM array, however, is determined by the collective, nonlinear dynamics of the array. There exists two key parameters that influence the AFM array response, namely the mechanical coupling strength and nonlinear interaction forces. We present a mathematical model of a coupled array of cantilevers subjected to nonlinear force interactions and demonstrate how changes in modal response can be used to enhance the sensitivity of AFM technology
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
Tapping mode Atomic Force Microscopy (AFM) provides phase images in addition to height and amplitude...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Atomic Force Microscopy (AFM) is a mature imaging technology that is utilised in a wide range of ap...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Since the invention of atomic force microscopy (AFM) researchers have been trying to increase imagin...
Recent advances in atomic-force microscopy have moved beyond the original quasistatic implementation...
The need for investigating the properties of new materials at nanoscale level continuously pushes th...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
A research trend in micro systems for resonant sensing is a sensitivity enhancement utilizing nonli...
Atomic force microscopy (AFM) uses a scanning process performed by a microcantilever probe to create...
In this chapter, we explore a mathematical modelling that describes the nonlinear dynamic behavior o...
AFM has some unique properties such as higher spatial resolution, mapping even a single molecule, si...
Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
Tapping mode Atomic Force Microscopy (AFM) provides phase images in addition to height and amplitude...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...
Atomic Force Microscopy (AFM) is a mature imaging technology that is utilised in a wide range of ap...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Since the invention of atomic force microscopy (AFM) researchers have been trying to increase imagin...
Recent advances in atomic-force microscopy have moved beyond the original quasistatic implementation...
The need for investigating the properties of new materials at nanoscale level continuously pushes th...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
A research trend in micro systems for resonant sensing is a sensitivity enhancement utilizing nonli...
Atomic force microscopy (AFM) uses a scanning process performed by a microcantilever probe to create...
In this chapter, we explore a mathematical modelling that describes the nonlinear dynamic behavior o...
AFM has some unique properties such as higher spatial resolution, mapping even a single molecule, si...
Tapping mode atomic force microscopy (AFM) provides phase images in addition to height and amplitude...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
As one branch of atomic force microscopy (AFM), dynamic atomic force microscopy (Dynamic AFM) uses a...
Tapping mode Atomic Force Microscopy (AFM) provides phase images in addition to height and amplitude...
The detection of higher modes of oscillation in atomic force microscopy can provide additional info...