The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by multi-angle reflectance of synchrotron radiation. The resulting index of refraction is higher resolution than previously measured values. It reveals new structures attributed to transitions from the 3d-core orbitals to the Σ^_(5,2) and the X^c_(5,2) conduction bands. Additionally, it is shown that the problem of total external reflection, which renders multi-angle reflectance measurements insensitive to the complex-valued refractive index at grazing incidence, can be overcome by employing measurements at angles of incidence away from the critical angle
By passing a periodically interrupted current through a germanium sample, modulation of the spectral...
The band structure of germanium in the energy region .7 eV to 5 eV was investigated using the electr...
In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few...
The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by ...
The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by ...
Coherent radiation from undulator beamlines has been used to directly measure the real and imaginary...
It is difficult to measure the reflectance of thin films accurately in the extreme ultraviolet due t...
The response of a given material to an incident electromagnetic wave is described by the energy depe...
We measured the refractive index of germanium and gold prisms at 1.7 MeV to explore if there are ref...
The supplementary material gives the complex refractive index (n, k) of Ge measured by the spectrosc...
The dispersive part of the refractive index, 1−δ, of vanadium is determined by measuring the angular...
The advent of attosecond pulse duration light sources has enabled the study of fundamental light-mat...
The optical absorption coefficient of pure Ge has been determined from high-accuracy, high-precision...
We present results of the analysis of K-edge X-ray-absorption spectra of crystalline, amorphous, and...
Electron density profiles across the 90-270 Å depth of Al/C multilayers on Ge substrates are determi...
By passing a periodically interrupted current through a germanium sample, modulation of the spectral...
The band structure of germanium in the energy region .7 eV to 5 eV was investigated using the electr...
In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few...
The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by ...
The complex-valued index of refraction of germanium in the extreme ultraviolet (XUV) is measured by ...
Coherent radiation from undulator beamlines has been used to directly measure the real and imaginary...
It is difficult to measure the reflectance of thin films accurately in the extreme ultraviolet due t...
The response of a given material to an incident electromagnetic wave is described by the energy depe...
We measured the refractive index of germanium and gold prisms at 1.7 MeV to explore if there are ref...
The supplementary material gives the complex refractive index (n, k) of Ge measured by the spectrosc...
The dispersive part of the refractive index, 1−δ, of vanadium is determined by measuring the angular...
The advent of attosecond pulse duration light sources has enabled the study of fundamental light-mat...
The optical absorption coefficient of pure Ge has been determined from high-accuracy, high-precision...
We present results of the analysis of K-edge X-ray-absorption spectra of crystalline, amorphous, and...
Electron density profiles across the 90-270 Å depth of Al/C multilayers on Ge substrates are determi...
By passing a periodically interrupted current through a germanium sample, modulation of the spectral...
The band structure of germanium in the energy region .7 eV to 5 eV was investigated using the electr...
In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few...