University of Minnesota Ph.D. dissertation. March 2017. Major: Electrical Engineering. Advisor: Murti Salapaka. 1 computer file (PDF); ix, 158 pages.The atomic force microscope (AFM) is one of the major advancements in recent science that has enabled imaging of samples at the nanometer and sub-nanometer scale. Over the years, different techniques have been developed to improve the speed, resolution and accuracy of imaging using AFM. Further, the application spectrum of AFMs has extended beyond topography imaging, examples of which include material characterization, probe based data storage systems, and also single molecule force spectroscopy. In spite of the remarkable achievements by AFM technologies, many challenges exist. While majority...
Engineering the next generation of smart materials will require new methods of surface characterizat...
Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For ...
Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For ...
Thesis (Ph.D.)--University of Washington, 2018In the last decades, nanotechnology has built great ex...
Atomic force microscopy (AFM) has become a key enabling technology for high-precision study of mater...
The atomic force microscope (AFM) is a very promising and powerful tool for investigating a range of...
Tesis Doctoral inédita leída en la Universidad Autónoma de Madrid, Facultad de Ciencias, Departament...
From the invention of the atomic force microscope (AFM) in 1986, tremendous efforts have been put in...
Optical microscopy uses the interactions between light and materials to provide images of the micros...
University of Minnesota Ph.D. dissertation. September 2011. Major:Electrical Engineering. Advisor: D...
Video-rate imaging and property sensing with nanoscale precision is a subject of immense interest to...
AFM images can be used to obtain quantitative or qualitative information about the properties of bio...
Atomic force microscopy (AFM) is a class of high-resolution scanning probe microscopy (SPM) for non-...
The atomic force microscope (AFM) has become one of the leading nanoscale measurement techniques for...
Atomic Force Microscopy (AFM) has become an indispensable tool for imaging the properties of surface...
Engineering the next generation of smart materials will require new methods of surface characterizat...
Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For ...
Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For ...
Thesis (Ph.D.)--University of Washington, 2018In the last decades, nanotechnology has built great ex...
Atomic force microscopy (AFM) has become a key enabling technology for high-precision study of mater...
The atomic force microscope (AFM) is a very promising and powerful tool for investigating a range of...
Tesis Doctoral inédita leída en la Universidad Autónoma de Madrid, Facultad de Ciencias, Departament...
From the invention of the atomic force microscope (AFM) in 1986, tremendous efforts have been put in...
Optical microscopy uses the interactions between light and materials to provide images of the micros...
University of Minnesota Ph.D. dissertation. September 2011. Major:Electrical Engineering. Advisor: D...
Video-rate imaging and property sensing with nanoscale precision is a subject of immense interest to...
AFM images can be used to obtain quantitative or qualitative information about the properties of bio...
Atomic force microscopy (AFM) is a class of high-resolution scanning probe microscopy (SPM) for non-...
The atomic force microscope (AFM) has become one of the leading nanoscale measurement techniques for...
Atomic Force Microscopy (AFM) has become an indispensable tool for imaging the properties of surface...
Engineering the next generation of smart materials will require new methods of surface characterizat...
Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For ...
Imaging of nano-sized particles and sample features is crucial in a variety of research fields. For ...