Continued scaling of semiconductor technology has made modern processors rely on large design margins to guarantee correct operation under worst case conditions. Design margins appear in the form of higher supply voltage or lower clock frequency, leading to inefficiency. In practice, it is rare to observe such worst-case conditions and the processor can run at a reduced voltage or higher frequency experiencing only few infrequent errors. Recent proposals have used hardware error detectors and recovery mechanisms to detect and re- cover from these rare errors, a technique known as timing speculation. While this is effective for out-of-order processors with inherent capability to recover from misspeculation, implementing similar hardware for ...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
The checkpoint and rollback recovery techniques enable a system to survive failures by periodically ...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
Resilience is a continuing concern for extreme-scale scientific applications. Tolerating the ever-i...
textRecent graphics processing units (GPUs) have emerged as a promising platform for general purpose...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
Recent increases in hard fault rates in modern chip multi-processors have led to a variety of approa...
As late-CMOS process scaling leads to increasingly variable circuits/logic and as most post-CMOS tec...
textIn the recent past, there has been an increasing demand for low-cost safety critical application...
As technology feature size continues to shrink, we see two challenging problems in designing compute...
Transient hardware faults have become one of the major concerns affecting the reliability of modern ...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
System reliability is becoming a significant concern as technology continues to shrink. This is beca...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
The checkpoint and rollback recovery techniques enable a system to survive failures by periodically ...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...
Resilience is a continuing concern for extreme-scale scientific applications. Tolerating the ever-i...
textRecent graphics processing units (GPUs) have emerged as a promising platform for general purpose...
Conventional CAD methodologies optimize a processor module for correct operation and prohibit timing...
Conventional computer-aided design (CAD) methodologies optimize a processor module for correct opera...
Recent increases in hard fault rates in modern chip multi-processors have led to a variety of approa...
As late-CMOS process scaling leads to increasingly variable circuits/logic and as most post-CMOS tec...
textIn the recent past, there has been an increasing demand for low-cost safety critical application...
As technology feature size continues to shrink, we see two challenging problems in designing compute...
Transient hardware faults have become one of the major concerns affecting the reliability of modern ...
In recent years, circuit reliability in modern high-performance processors has become increasingly i...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
System reliability is becoming a significant concern as technology continues to shrink. This is beca...
According to Moore’s law, technology scaling is continuously providing smaller and faster devices. T...
The checkpoint and rollback recovery techniques enable a system to survive failures by periodically ...
As semiconductor technology scales into the deep submicron regime the occurrence of transient or sof...