\u3cp\u3eThis letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niobium oxide (Nb\u3csub\u3e2\u3c/sub\u3eO\u3csub\u3e5\u3c/sub\u3e) films prepared by atomic layer deposition (ALD) and subjected to a forming gas anneal at 300 °C. A champion recombination parameter J\u3csub\u3e0\u3c/sub\u3e of 20 fA/cm\u3csup\u3e2\u3c/sup\u3e and a surface recombination velocity S\u3csub\u3eeff\u3c/sub\u3e of 4.8 cm/s have been achieved for ultrathin films of 1 nm. The surface pretreatment was found to have a strong impact on the passivation. Good passivation can be achieved on both HF-treated c-Si surfaces and c-Si surfaces with a wet-chemically grown interfacial silicon oxide layer. On HF-treated surfaces, a minimum ...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
\u3cp\u3ePassivating contacts based on metal oxides have proven to enable high energy conversion eff...
Passivating contacts based on metal oxides have proven to enable high energy conversion efficiencies...
Passivating contacts based on metal oxides have proven to enable high energy conversion efficiencies...
\u3cp\u3eThin-film stacks of phosphorus oxide (PO\u3csub\u3ex\u3c/sub\u3e) and aluminium oxide (Al\u...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
This letter reports on effective surface passivation of n-type crystalline silicon by ultrathin niob...
\u3cp\u3ePassivating contacts based on metal oxides have proven to enable high energy conversion eff...
Passivating contacts based on metal oxides have proven to enable high energy conversion efficiencies...
Passivating contacts based on metal oxides have proven to enable high energy conversion efficiencies...
\u3cp\u3eThin-film stacks of phosphorus oxide (PO\u3csub\u3ex\u3c/sub\u3e) and aluminium oxide (Al\u...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...
In this Letter, we report that both thermal atomic layer deposition (ALD) with H2O, and plasma ALD w...