The catastrophic degradation of laser diodeswith active zones comprising either single (SQW) or multiple quantum wells (MQW) has been analysed via finite elementmethods. This analysis is based on a physical model that explicitly considers the thermal and mechanical properties of the diode laser structure and the relevant size effects associated with the small thickness of the active layers of the device. The reduced thermal conductivities and the thermal barriers at the interfaces result in a significant local heating process which is accentuated as more quantum wells form the active part of the device. Therefore, in the design of high power devices, the SQW configuration would be more appropriate than the MQW alternative.Junta de Castilla...
This paper proposes and demonstrates a new multiquantum well (MQW) laser structure with a temperatur...
<p>Thermomechanical behavior has an important effect on reliability and lifetime of high-power diode...
333-338The effect of rapid thermal annealing to device performance of InGaAs/AlGaAs quantum well las...
Producción Científican this work we investigate the catastrophic optical damage (COD) of GaAS based ...
Catastrophic optical damage (COD) of high power laser diodes is a crucial factor limiting ultra hig...
Producción CientíficaThe catastrophic degradation of high power lasers depends on both external fact...
Producción CientíficaThe defects generated by the catastrophic optical degradation (COD) of high pow...
Producción CientíficaCatastrophic optical damage (COD) is one of the processes limiting the lifetime...
Producción CientíficaThe catastrophic optical damage (COD) of laser diodes consists of the sudden dr...
Infra-red (IR) laser induced selective-area quantum well intermixing (QWI) has the potential to yiel...
Infra-red (IR) laser induced selective-area quantum well intermixing (QWI) has the potential to yiel...
The effect of quantum well (QW) strain on the thermal performance of In- GaP/InGaAlP lasers emittin...
Facet overheating is considered a potential source for device degradation of diode lasers. We test t...
Abstract—We analyze the high-temperature continuous-wave performance of 1.3- m AlGaInAs/InP laser di...
The effect of rapid thermal annealing to device performance of InGaAs/AlGaAs quantum well laser diod...
This paper proposes and demonstrates a new multiquantum well (MQW) laser structure with a temperatur...
<p>Thermomechanical behavior has an important effect on reliability and lifetime of high-power diode...
333-338The effect of rapid thermal annealing to device performance of InGaAs/AlGaAs quantum well las...
Producción Científican this work we investigate the catastrophic optical damage (COD) of GaAS based ...
Catastrophic optical damage (COD) of high power laser diodes is a crucial factor limiting ultra hig...
Producción CientíficaThe catastrophic degradation of high power lasers depends on both external fact...
Producción CientíficaThe defects generated by the catastrophic optical degradation (COD) of high pow...
Producción CientíficaCatastrophic optical damage (COD) is one of the processes limiting the lifetime...
Producción CientíficaThe catastrophic optical damage (COD) of laser diodes consists of the sudden dr...
Infra-red (IR) laser induced selective-area quantum well intermixing (QWI) has the potential to yiel...
Infra-red (IR) laser induced selective-area quantum well intermixing (QWI) has the potential to yiel...
The effect of quantum well (QW) strain on the thermal performance of In- GaP/InGaAlP lasers emittin...
Facet overheating is considered a potential source for device degradation of diode lasers. We test t...
Abstract—We analyze the high-temperature continuous-wave performance of 1.3- m AlGaInAs/InP laser di...
The effect of rapid thermal annealing to device performance of InGaAs/AlGaAs quantum well laser diod...
This paper proposes and demonstrates a new multiquantum well (MQW) laser structure with a temperatur...
<p>Thermomechanical behavior has an important effect on reliability and lifetime of high-power diode...
333-338The effect of rapid thermal annealing to device performance of InGaAs/AlGaAs quantum well las...