Producción CientíficaThe defects generated by the catastrophic optical degradation (COD) of high power laser diodes have been examined using cathodoluminescence (CL). Discontinuous dark lines that correspond to different levels of damage have been observed along the ridge. Finite element methods have been applied to solve a physical model for the degradation of the diodes that explicitly considers the thermal and mechanical properties of the laser structure. According to this model, the COD is triggered by a local temperature enhancement that gives rise to thermal stresses leading to the generation of dislocations. Damage is initially localized in the QW, and when it propagates to the waveguide layers the laser ends its life.Junta de Castil...
The catastrophic degradation of laser diodeswith active zones comprising either single (SQW) or mult...
This paper presents an extensive analysis of the degradation of InGaN-based laser diodes submitted t...
This paper presents an extensive analysis of the degradation of InGaN-based laser diodes submitted t...
Producción CientíficaThe catastrophic degradation of high power lasers depends on both external fact...
Catastrophic optical damage (COD) of high power laser diodes is a crucial factor limiting ultra hig...
Producción CientíficaThe catastrophic optical damage (COD) of laser diodes consists of the sudden dr...
Producción CientíficaCathodoluminescence is a powerful technique for the characterization of semicon...
Producción Científican this work we investigate the catastrophic optical damage (COD) of GaAS based ...
Producción CientíficaCatastrophic optical damage (COD) is one of the processes limiting the lifetime...
Producción CientíficaDegradation of laser diodes during operation constitutes a serious drawback for...
Damage patterns caused by the Catastrophic Optical Damage (COD) are analyzed in GaN-based high-power...
In dieser Arbeit wird der Catastrophic Optical Damage (COD) zeitaufgelöst untersucht um die beteili...
Gallium-nitride-based diode lasers were intentionally damaged using single sub-μs current pulses. Th...
Gallium-nitride-based diode lasers were intentionally damaged using single sub-μs current pulses. Th...
A study of catastrophic degradation of InGaN/GaN laser diodes (LDs) is presented. Local damage on th...
The catastrophic degradation of laser diodeswith active zones comprising either single (SQW) or mult...
This paper presents an extensive analysis of the degradation of InGaN-based laser diodes submitted t...
This paper presents an extensive analysis of the degradation of InGaN-based laser diodes submitted t...
Producción CientíficaThe catastrophic degradation of high power lasers depends on both external fact...
Catastrophic optical damage (COD) of high power laser diodes is a crucial factor limiting ultra hig...
Producción CientíficaThe catastrophic optical damage (COD) of laser diodes consists of the sudden dr...
Producción CientíficaCathodoluminescence is a powerful technique for the characterization of semicon...
Producción Científican this work we investigate the catastrophic optical damage (COD) of GaAS based ...
Producción CientíficaCatastrophic optical damage (COD) is one of the processes limiting the lifetime...
Producción CientíficaDegradation of laser diodes during operation constitutes a serious drawback for...
Damage patterns caused by the Catastrophic Optical Damage (COD) are analyzed in GaN-based high-power...
In dieser Arbeit wird der Catastrophic Optical Damage (COD) zeitaufgelöst untersucht um die beteili...
Gallium-nitride-based diode lasers were intentionally damaged using single sub-μs current pulses. Th...
Gallium-nitride-based diode lasers were intentionally damaged using single sub-μs current pulses. Th...
A study of catastrophic degradation of InGaN/GaN laser diodes (LDs) is presented. Local damage on th...
The catastrophic degradation of laser diodeswith active zones comprising either single (SQW) or mult...
This paper presents an extensive analysis of the degradation of InGaN-based laser diodes submitted t...
This paper presents an extensive analysis of the degradation of InGaN-based laser diodes submitted t...