We have investigated the optical resolution of a scanning near-field optical microscope in reflection collection mode using an uncoated fiber tip. We demonstrate that the apparent resolution in the optical signal (better than 70 nm) is a topography-induced effect. We believe that the purely optical resolution is only of the order of lambda/2 and diffraction limited. (C) 1997 American Institute of Physics
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
We have investigated the optical resolution of a scanning near-field optical microscope in reflectio...
We show that lateral resolution well beyond 100 nm can be obtained in scanning near-field optical mi...
Bu çalışma, 9-13 Şubat 1997 tarihlerinde İsrail'de düzenlenen 4. International Conference on Near-Fi...
We show improvement of the optical and topographical resolution of scanning near-field optical micro...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
A Fluorescence Scanning Near-Field Optical Microscope operated in reflection is presented. A pulled ...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
We have investigated the optical resolution of a scanning near-field optical microscope in reflectio...
We show that lateral resolution well beyond 100 nm can be obtained in scanning near-field optical mi...
Bu çalışma, 9-13 Şubat 1997 tarihlerinde İsrail'de düzenlenen 4. International Conference on Near-Fi...
We show improvement of the optical and topographical resolution of scanning near-field optical micro...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
International audienceIn the last ten years, several different set-ups for producing images with sup...
A Fluorescence Scanning Near-Field Optical Microscope operated in reflection is presented. A pulled ...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...
Using cross-hatched, patterned semiconductor surfaces and round 20-nm-thick gold pads on semiconduct...