AbstractA method for hardness measurement and evaluation of thin films on the material surface was proposed. Firstly, it is studied how to obtain the force-indentation response with a finite element method when the indentation is less than 100 nanometers, in which current nanoindentation experiments have not reliable accuracy. The whole hardness-indentation curve and fitted equation were obtained. At last, a formula to predict the hardness of the thin film on the material surface was derived and favorably compared with experiments
One of the major topics in novel microelectronics are thin film materials - especially their mechani...
AbstractSeveral methods of microhardness and nanoindentation test on the surface layer of material a...
AbstractNanoindentation has become a common technique for measuring hardness and elastic-plastic pro...
Thin solid films were extensively used in the making of solar cells, cutting tools, magnetic recordi...
This article gives an overview of current techniques to determine hardness, Young's modulus and stre...
Due to the influence of the substrate, direct measurement of the hardness of thin films by standard ...
Simple equations are proposed for determining elastic modulus and hardness properties of thin films ...
In the present paper, the hardness and Young's modulus of film-substrate systems are determined by m...
This study explores the difficulties encountered when using conventional nanoindentation techniques ...
The Brinell, Vickers, Meyer, Rockwell, Shore, IHRD, Knoop, Buchholz, and nanoindentation methods use...
Abstract According to the principle of a conventional Vickers (Berkovich) hardness measurement, hard...
10.1142/S0217979210064198International Journal of Modern Physics B241-2256-266IJPB
Hardness measurement of thin films is a major topic. At the nanoscale the interplay between substrat...
In this work, the applicability of a new algorithm for the estimation of mechanical properties from ...
We present a methodology based on finite-element modeling of nanoindentation data to extract reliabl...
One of the major topics in novel microelectronics are thin film materials - especially their mechani...
AbstractSeveral methods of microhardness and nanoindentation test on the surface layer of material a...
AbstractNanoindentation has become a common technique for measuring hardness and elastic-plastic pro...
Thin solid films were extensively used in the making of solar cells, cutting tools, magnetic recordi...
This article gives an overview of current techniques to determine hardness, Young's modulus and stre...
Due to the influence of the substrate, direct measurement of the hardness of thin films by standard ...
Simple equations are proposed for determining elastic modulus and hardness properties of thin films ...
In the present paper, the hardness and Young's modulus of film-substrate systems are determined by m...
This study explores the difficulties encountered when using conventional nanoindentation techniques ...
The Brinell, Vickers, Meyer, Rockwell, Shore, IHRD, Knoop, Buchholz, and nanoindentation methods use...
Abstract According to the principle of a conventional Vickers (Berkovich) hardness measurement, hard...
10.1142/S0217979210064198International Journal of Modern Physics B241-2256-266IJPB
Hardness measurement of thin films is a major topic. At the nanoscale the interplay between substrat...
In this work, the applicability of a new algorithm for the estimation of mechanical properties from ...
We present a methodology based on finite-element modeling of nanoindentation data to extract reliabl...
One of the major topics in novel microelectronics are thin film materials - especially their mechani...
AbstractSeveral methods of microhardness and nanoindentation test on the surface layer of material a...
AbstractNanoindentation has become a common technique for measuring hardness and elastic-plastic pro...