Radiation testing of electronics for the CMS endcap muon system
- Bylsma, B.
- Cady, D.
- Celik, A.
- Durkin, L.S.
- Gilmore, J.
- Haley, J.
- Khotilovich, V.
- Lakdawala, S.
- Liu, J.
- Matveev, M.
- Padley, B.P.
- Roberts, J.
- Roe, J.
- Safonov, A.
- Suarez, I.
- Wood, D.
- Zawisza, I.
DOIAbstract
AbstractThe electronics used in the data readout and triggering system for the Compact Muon Solenoid (CMS) experiment at the Large Hadron Collider (LHC) particle accelerator at CERN are exposed to high radiation levels. This radiation can cause permanent damage to the electronic circuitry, as well as temporary effects such as data corruption induced by Single Event Upsets. Once the High Luminosity LHC (HL-LHC) accelerator upgrades are completed it will have five times higher instantaneous luminosity than LHC, allowing for detection of rare physics processes, new particles and interactions. Tests have been performed to determine the effects of radiation on the electronic components to be used for the Endcap Muon electronics project currently...
Add to ORKG