XRD, optical and AFM studies on pristine and partially iodized Ag thin film

AbstractThis study has shown that thermally evaporated Ag thin films neither too thin (ultra-thin) nor too thick (foil)—50 and 130nm thick films used here—are ideal for investigating surface modification by a simple iodization procedure for less than ∼15min. XRD, optical, AFM have helped track the interesting changes such as appearance of surface plasmon absorption and initiation of Ag crystalline formation at the nanostructure level. The 50nm, Ag films show gradual development of surface Plasmon resonance and brood visible bands forward by raising absorption in contrast 130nm Ag films show flat absorbance over the wavelength 350–800nm with absorbance systemically reducing upon the increase of iodization time. The systemic trends absorbance spectra should be useful in the design of detector bases in the iodine. Nanostructures supporting localized plasmons are the subject of intense research for their applications in plasmonics including nanophotonic devices, chemical sensors, and optical filters