Abstract Interference signals in coherence scanning interferometry at high numerical apertures and narrow bandwidth illumination are spectrally broadened. This enables phase analysis within a spectral range much wider than the spectral distribution of the light emitted by the light source. Consequently, different surface features can be resolved depending on the wavelength used for phase analysis of the interference signals. In addition, the surface topography itself affects the spectral composition of interference signals in different ways. Signals related to tilted surfaces or step height structures show special spectral characteristics. Thus, spectral amplitude and phase analysis enables a better understanding of the underlying physical ...
When applied to the measurement of smooth surfaces, coherence scanning interferometry can be describ...
Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measu...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...
La microscopie interférométrique est une méthode de mesure qui repose sur l’acquisition et le traite...
This thesis deals with low-coherence interferometry, laser interferometry and its combination intend...
The capability of optical surface topography measurement methods for measurement of steep and tilted...
Within this work an alternative approach to precision surface profilometry based on a low-coherence ...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
International audienceInterference microscopy is a widely used technique in optical metrology for th...
The low-coherence interferometry is already an established technique for the high-resolution charact...
Mechanical vibrations in the frame of an interferometer can introduce a space-dependent factor throu...
We propose an instrument model for coherence scanning interferometry using familiar Fourier optics m...
The effect of the width of the angular spectrum (numerical aperture) of a broadband-frequency wave-f...
Countless industrial applications over the past decades have indicated the increased need to relate ...
Editors:Prathan Buranasiri,Sarun SumriddetchkajornA brief review is presented for recent progress in...
When applied to the measurement of smooth surfaces, coherence scanning interferometry can be describ...
Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measu...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...
La microscopie interférométrique est une méthode de mesure qui repose sur l’acquisition et le traite...
This thesis deals with low-coherence interferometry, laser interferometry and its combination intend...
The capability of optical surface topography measurement methods for measurement of steep and tilted...
Within this work an alternative approach to precision surface profilometry based on a low-coherence ...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
International audienceInterference microscopy is a widely used technique in optical metrology for th...
The low-coherence interferometry is already an established technique for the high-resolution charact...
Mechanical vibrations in the frame of an interferometer can introduce a space-dependent factor throu...
We propose an instrument model for coherence scanning interferometry using familiar Fourier optics m...
The effect of the width of the angular spectrum (numerical aperture) of a broadband-frequency wave-f...
Countless industrial applications over the past decades have indicated the increased need to relate ...
Editors:Prathan Buranasiri,Sarun SumriddetchkajornA brief review is presented for recent progress in...
When applied to the measurement of smooth surfaces, coherence scanning interferometry can be describ...
Coherence scanning interferometry (CSI) is a widely used optical method for surface topography measu...
This work introduces a modified low-coherence interferometry approach for nanometer surface-profilom...