We report experimental values of the complex dielectric permittivity of a wide variety of engineering polymers. Measurements were done using the filling waveguide method at Q-band (30–50 GHz), being representative of the values over the millimeter wave regime. This method has a high accuracy, providing excellent wide-bandwidth characterization. Measured samples include the most common engineering materials as polyamide, polyethylene, polytetrafluoroethylene, polyoxymethylene, polylactic acid, phenol formaldehyde resin, polypropylene, polyvinyl chloride, acrylonitrile butadiene styrene, polyphenyle sulfide, and polyether ether ketone. Results are comprehensive and represent an important contribution to the technical literature which lacks of...
3D-printer materials are becoming increasingly appealing, especially for high frequency applications...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Additive manufacturing has brought a technological revolution which up to now has shown only glimpse...
Additive manufacturing has brought a technological revolution which up to now has shown only glimpse...
SECTION 6: OPTICAL COMMUNICATIONS (OC) [06.08]International audienceWe report here a technique that ...
A new configuration of dielectric loaded resonator, particularly versatile for the complex permittiv...
This work presents the measurement of the complex permittivities of high density polyethylene (HDPE)...
The work of this article is a contribution to the characterization of new materials at microwave fre...
Complex permittivity of a substrate plays an important role in designing a compact and robust antenn...
This paper presents, for the first time, a multimodal sensor for characterizing relative permittivit...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
Nowadays, Fused Deposition Modeling represents the most common method used in the 3D-printing proces...
The material properties of greatest importance in microwave processing of a dielectric are the compl...
3D-printer materials are becoming increasingly appealing, especially for high frequency applications...
3D-printer materials are becoming increasingly appealing, especially for high frequency applications...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Additive manufacturing has brought a technological revolution which up to now has shown only glimpse...
Additive manufacturing has brought a technological revolution which up to now has shown only glimpse...
SECTION 6: OPTICAL COMMUNICATIONS (OC) [06.08]International audienceWe report here a technique that ...
A new configuration of dielectric loaded resonator, particularly versatile for the complex permittiv...
This work presents the measurement of the complex permittivities of high density polyethylene (HDPE)...
The work of this article is a contribution to the characterization of new materials at microwave fre...
Complex permittivity of a substrate plays an important role in designing a compact and robust antenn...
This paper presents, for the first time, a multimodal sensor for characterizing relative permittivit...
Measurement of Complex Permittivity (ε* = ε´ - i ε´´) of dielectric materials have been of substanti...
Nowadays, Fused Deposition Modeling represents the most common method used in the 3D-printing proces...
The material properties of greatest importance in microwave processing of a dielectric are the compl...
3D-printer materials are becoming increasingly appealing, especially for high frequency applications...
3D-printer materials are becoming increasingly appealing, especially for high frequency applications...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...
Complex permittivity measurement of low permittivity thin films is necessary to understand the funda...