The oxidation of silicon (Si) has been extensively investigated over the past 50 years. Yet, an understanding of the mechanism and rate of liquid Si oxidation in atmospheres containing water vapor, is lacking. The effect of water vapor on the oxidation process is of particular importance in the industrial, metallurgical production and processing of liquid silicon, as a significant amount of silica fume is generated under such conditions. The generation of fume is due to the active oxidation of liquid metal in the tapping, refining, and casting stepsa major occupational health and safety challenge for the Si producers. In this work, the effect of water vapor in the atmosphere on the Si oxidation rate and fume characteristics was investigate...
We have studied the oxidation behaviour of 350 nm thick films of Si0.5Ge0.5 alloy grown on Si(100) s...
The oxidation of a (Mo, W)Si2-based composite was investigated in the temperature range (350–950 °C)...
This work presents a wide range of growth rate data of thin (1-60 nm) silicon oxides grown in an ult...
The formation of silica fume when liquid metal is in contact with air during refining of metallurgic...
The initial stage of oxidation (up to 600s) in air and air-H2O atmospheres was investigated for Fe a...
In this work, we make steps towards developing a new wet-oxidation model of silicon based on electro...
Silicon undergoes oxidation at room temperature, causing a formation of an oxide layer on its surfac...
The theory of the kinetics of the thermal oxidation of silicon is extended after critical examinatio...
Wet Thermal Oxidation of Silicon in VLSI is an extremely important step in the formation of field ox...
The aim of this work was to study the effect of flow rate on the fuming rate/silica flux of liquid s...
Silicon oxidation in wet ambients is simulated based on the interfacial silicon emission model and i...
The volatilization of silica (SiO2) to silicon hydroxides and oxyhydroxides because of reaction with...
The oxidation characteristics of a MoSi2-based composite in O2 and O2+10% H2O at 600 and 700 \ub0C w...
The oxidation characteristics of a MoSi2-based composite in O2 and O2+10% H2O at 600 and 700 °C were...
The formation of volatile silicon-hydroxide species from SiO2 in water containing atmospheres has be...
We have studied the oxidation behaviour of 350 nm thick films of Si0.5Ge0.5 alloy grown on Si(100) s...
The oxidation of a (Mo, W)Si2-based composite was investigated in the temperature range (350–950 °C)...
This work presents a wide range of growth rate data of thin (1-60 nm) silicon oxides grown in an ult...
The formation of silica fume when liquid metal is in contact with air during refining of metallurgic...
The initial stage of oxidation (up to 600s) in air and air-H2O atmospheres was investigated for Fe a...
In this work, we make steps towards developing a new wet-oxidation model of silicon based on electro...
Silicon undergoes oxidation at room temperature, causing a formation of an oxide layer on its surfac...
The theory of the kinetics of the thermal oxidation of silicon is extended after critical examinatio...
Wet Thermal Oxidation of Silicon in VLSI is an extremely important step in the formation of field ox...
The aim of this work was to study the effect of flow rate on the fuming rate/silica flux of liquid s...
Silicon oxidation in wet ambients is simulated based on the interfacial silicon emission model and i...
The volatilization of silica (SiO2) to silicon hydroxides and oxyhydroxides because of reaction with...
The oxidation characteristics of a MoSi2-based composite in O2 and O2+10% H2O at 600 and 700 \ub0C w...
The oxidation characteristics of a MoSi2-based composite in O2 and O2+10% H2O at 600 and 700 °C were...
The formation of volatile silicon-hydroxide species from SiO2 in water containing atmospheres has be...
We have studied the oxidation behaviour of 350 nm thick films of Si0.5Ge0.5 alloy grown on Si(100) s...
The oxidation of a (Mo, W)Si2-based composite was investigated in the temperature range (350–950 °C)...
This work presents a wide range of growth rate data of thin (1-60 nm) silicon oxides grown in an ult...