Pour maintenir leur compétitivité, les industries du semi-conducteur doivent être en mesure de produire des circuits intégrés en technologies avancées, avec des temps de cycle de plus en plus courts et à des coûts raisonnables. Un des axes d’amélioration réside dans le traitement des défaillances des équipements de production tenus responsables de plus de 50%des rejets produits. Cette thèse se fixe comme objectif de contribuer au développement d’une boucle réactive partant d’une dérive produit à la mise en place d’une solution appropriée tout en assurant un meilleur compromis entre disponibilité des équipements, coûts d’exploitation, qualité et compétitivité du produit. Joignant l’expertise humaine et les événements réels, nous nous sommes ...
Testing the reliability of Smart Power semiconductor devices is highly time and cost consuming. Neve...
Eine der größten Herausforderungen in der Produktentwicklung von Industrieunternehmen moderner Volks...
Since the availability of components, systems and subsystems in an assembly line is an indicator of ...
Today, the semiconductor industry must be able to produce Integrated Circuit (IC) withreduced cycle ...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
International audienceThe evolution of microelectronics is characterized by an intense competitive e...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
International audienceThis work takes place within the IMPROVE European project aimed at increasing ...
International audienceThe production of microelectronic components is characterized by an important ...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
This paper presents a comparison of three algorithm types (Bayesian Networks, Random Forest and Line...
A Bayesian network (BN) is a powerful tool to represent the quantitative and qualitative features of...
Abstract: We present a new Bayesian network modeling that learns the behavior of an unknown system f...
Ce travail de thèse concerne le développement d'une méthode de pronostic de défaillance des systèmes...
Testing the reliability of Smart Power semiconductor devices is highly time and cost consuming. Neve...
Eine der größten Herausforderungen in der Produktentwicklung von Industrieunternehmen moderner Volks...
Since the availability of components, systems and subsystems in an assembly line is an indicator of ...
Today, the semiconductor industry must be able to produce Integrated Circuit (IC) withreduced cycle ...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
International audienceThe evolution of microelectronics is characterized by an intense competitive e...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
International audienceThis work takes place within the IMPROVE European project aimed at increasing ...
International audienceThe production of microelectronic components is characterized by an important ...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
This paper presents a comparison of three algorithm types (Bayesian Networks, Random Forest and Line...
A Bayesian network (BN) is a powerful tool to represent the quantitative and qualitative features of...
Abstract: We present a new Bayesian network modeling that learns the behavior of an unknown system f...
Ce travail de thèse concerne le développement d'une méthode de pronostic de défaillance des systèmes...
Testing the reliability of Smart Power semiconductor devices is highly time and cost consuming. Neve...
Eine der größten Herausforderungen in der Produktentwicklung von Industrieunternehmen moderner Volks...
Since the availability of components, systems and subsystems in an assembly line is an indicator of ...