In this paper, we have developed an interpretation of transistor -parameters by poles and zeros. The results from our proposed method agreed well with experimental data from GaAs FETs and Si MOSFET’s. The concept of source-series feedback was employed to analyze a transistor circuit set up for the measurement of the -parameters. Our method can describe the frequency responses of all transistor -parameters very easily and the calculated -parameters are scalable with device sizes. It was also found that the long-puzzled kink phenomenon of observed in a Smith chart can be explained by the poles and zeros of
[[abstract]]Two different explanations of the S-22 kink phenomenon in deep-submicrometer RF MOSFETs ...
Recently, new behavioral model formulations have been introduced to describe transistor non-linear b...
[[abstract]]In this work, a dummy open device with ground guard-ring and another dummy open device w...
[[abstract]]In this paper, the kink effect in scattering parameter S., of RF power MOSFETs with drai...
[[abstract]]In this paper, we demonstrate an analysis of the effects of transconductance g(m) on the...
[[abstract]]In this paper, we demonstrate an analysis of the effects of transconductance g(m) on the...
[[abstract]]In this paper, the kink effect in scattering parameter S., of RF power MOSFETs with drai...
[[abstract]]A method for estimating the S-parameters of active circuits using hand analysis is intro...
[[abstract]]A method for estimating the S-parameters of active circuits using hand analysis is intro...
[[abstract]]Two different explanations of the S-22 kink phenomenon in deep-submicrometer RF MOSFETs ...
A method for estimating the -parameters of active circuits using hand analysis is introduced. This m...
[[abstract]]In this paper, we demonstrate a comprehensive analysis of small-signal source-body resis...
The operation of a typical common emitter amplifier, including negative feedback, is studied taking ...
In the development of a nonlinear transistor model, several measurements are used to extract equival...
[[abstract]]In this paper, we demonstrate a comprehensive analysis of small-signal source-body resis...
[[abstract]]Two different explanations of the S-22 kink phenomenon in deep-submicrometer RF MOSFETs ...
Recently, new behavioral model formulations have been introduced to describe transistor non-linear b...
[[abstract]]In this work, a dummy open device with ground guard-ring and another dummy open device w...
[[abstract]]In this paper, the kink effect in scattering parameter S., of RF power MOSFETs with drai...
[[abstract]]In this paper, we demonstrate an analysis of the effects of transconductance g(m) on the...
[[abstract]]In this paper, we demonstrate an analysis of the effects of transconductance g(m) on the...
[[abstract]]In this paper, the kink effect in scattering parameter S., of RF power MOSFETs with drai...
[[abstract]]A method for estimating the S-parameters of active circuits using hand analysis is intro...
[[abstract]]A method for estimating the S-parameters of active circuits using hand analysis is intro...
[[abstract]]Two different explanations of the S-22 kink phenomenon in deep-submicrometer RF MOSFETs ...
A method for estimating the -parameters of active circuits using hand analysis is introduced. This m...
[[abstract]]In this paper, we demonstrate a comprehensive analysis of small-signal source-body resis...
The operation of a typical common emitter amplifier, including negative feedback, is studied taking ...
In the development of a nonlinear transistor model, several measurements are used to extract equival...
[[abstract]]In this paper, we demonstrate a comprehensive analysis of small-signal source-body resis...
[[abstract]]Two different explanations of the S-22 kink phenomenon in deep-submicrometer RF MOSFETs ...
Recently, new behavioral model formulations have been introduced to describe transistor non-linear b...
[[abstract]]In this work, a dummy open device with ground guard-ring and another dummy open device w...