I have measured the refractive index of zinc selenide for wavelengths between 8 and 12 mum and temperatures from 85 to 300 K. Each measurement was made by finding the deviation angle of a beam perpendicularly incident on a right triangle prism. The resulting data curves are fitted to polynomials for the temperature dependence and to three different dispersion formulae for the wavelength dependence. I achieved accuracies in the refractive index of ±0.0008 and my results agree well with most previously available data. Refinements to the previously established experimental procedure and error analysis are also presented.Digitization note: p. 38 missing from paper original
We report results from a systematic study of the linear refractive index of thin films made of As - ...
A single-oscillator Lorentz model is applied to four different semiconductors having diamond-like cr...
In contemporary world optoelectronics materials are used in daily life owing to its verity of applic...
In order to enable high quality lens designs using N-BK7, BaLKN3, SF15, and E-SF03 at cryogenic temp...
Silicon and germanium are perhaps the two most well-understood semiconductor materials in the contex...
The temperature coefficients of the refractive indices of Ge, Si, InAs, GaAs, InP, GaP, CdSe, ZnSe, ...
SIGLEAvailable from British Library Document Supply Centre- DSC:2265.63F(BR--111748)(fiche) / BLDSC ...
In order to enable high quality lens designs using N-BK7, BaLKN3, and SF15 at cryogenic temperatures...
We present a determination of the change with temperature and wavelength of the degree of birefringe...
Using the Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Fligh...
International audienceData on the refractive index of silver thin films are scarce in the literature...
The well-known method presented by Swanepoel can be used to determine the refractive index dispersio...
This item was digitized from a paper original and/or a microfilm copy. If you need higher-resolution...
A single-oscillator Lorentz model is applied to four different semiconductors having diamond-like cr...
The measurements were made by a photographic method, for two positions of the crystal (1) with the o...
We report results from a systematic study of the linear refractive index of thin films made of As - ...
A single-oscillator Lorentz model is applied to four different semiconductors having diamond-like cr...
In contemporary world optoelectronics materials are used in daily life owing to its verity of applic...
In order to enable high quality lens designs using N-BK7, BaLKN3, SF15, and E-SF03 at cryogenic temp...
Silicon and germanium are perhaps the two most well-understood semiconductor materials in the contex...
The temperature coefficients of the refractive indices of Ge, Si, InAs, GaAs, InP, GaP, CdSe, ZnSe, ...
SIGLEAvailable from British Library Document Supply Centre- DSC:2265.63F(BR--111748)(fiche) / BLDSC ...
In order to enable high quality lens designs using N-BK7, BaLKN3, and SF15 at cryogenic temperatures...
We present a determination of the change with temperature and wavelength of the degree of birefringe...
Using the Cryogenic High Accuracy Refraction Measuring System (CHARMS) at NASA’s Goddard Space Fligh...
International audienceData on the refractive index of silver thin films are scarce in the literature...
The well-known method presented by Swanepoel can be used to determine the refractive index dispersio...
This item was digitized from a paper original and/or a microfilm copy. If you need higher-resolution...
A single-oscillator Lorentz model is applied to four different semiconductors having diamond-like cr...
The measurements were made by a photographic method, for two positions of the crystal (1) with the o...
We report results from a systematic study of the linear refractive index of thin films made of As - ...
A single-oscillator Lorentz model is applied to four different semiconductors having diamond-like cr...
In contemporary world optoelectronics materials are used in daily life owing to its verity of applic...