Despite the technological significance of carbon nanotube (CNT) arrays and metal-oxide coated CNTs for electronic and electrochemical devices such as supercapacitors, lithium-ion batteries, and solar-chemical cells, sub-optimal device performance often results due to large contact resistance between the CNTs and the metallic current collectors or between the CNTs and their ceramic coatings. While contact resistance measurements are regularly carried out on individually contacted CNTs, contact resistance measurements on vertically aligned (VA) CNT arrays are not routine. Here, we demonstrate that two-probe electrical current-voltage measurements and electrochemical impedance spectroscopy can be used to probe the end contact resistance and si...
The growth behaviors and contact resistances of vertically aligned carbon nanotubes (CNTs) and carbo...
We report on a non-invasive contact probing (NICP) system for measuring the distribution of local su...
ABSTRACT Recent studies and device demonstrations indicate that horizontally aligned arrays of linea...
Carbon nanotubes (CNT) are known to be materials with potential for manufacturing sub-20 nm high asp...
Vertically aligned carbon nanotubes grown by plasmaenhanced chemical vapor deposition offer a potent...
Moderate electrical contact resistance between two metal substrates has been reported when one of th...
Having an array of novel functionalities and performance advantages, Multi-Walled Carbon Nanotubes (...
Carbon-Nanotube (CNT) coated surfaces are investigated to determine theelectrical contact performanc...
We present an in-depth electrical characterization of contact resistance in carbon nanostructure via...
Benefits of employing carbon nanotubes (CNTs) as a component of large-scale composite structures inc...
We have fabricated electrical devices based on thermal chemical vapor deposition (TCVD) grown single...
Contact potential, conduction current, and electrical contact resistance were measured in air and in...
CNTs can have the ability to act as compliant small-scale springs or as shock resistance micro-conta...
We report on a non-invasive contact probing (NICP) system for measuring the distribution of local su...
To realize carbon nanotube (CNT) as on-chip interconnect materials, the contact resistance stemming ...
The growth behaviors and contact resistances of vertically aligned carbon nanotubes (CNTs) and carbo...
We report on a non-invasive contact probing (NICP) system for measuring the distribution of local su...
ABSTRACT Recent studies and device demonstrations indicate that horizontally aligned arrays of linea...
Carbon nanotubes (CNT) are known to be materials with potential for manufacturing sub-20 nm high asp...
Vertically aligned carbon nanotubes grown by plasmaenhanced chemical vapor deposition offer a potent...
Moderate electrical contact resistance between two metal substrates has been reported when one of th...
Having an array of novel functionalities and performance advantages, Multi-Walled Carbon Nanotubes (...
Carbon-Nanotube (CNT) coated surfaces are investigated to determine theelectrical contact performanc...
We present an in-depth electrical characterization of contact resistance in carbon nanostructure via...
Benefits of employing carbon nanotubes (CNTs) as a component of large-scale composite structures inc...
We have fabricated electrical devices based on thermal chemical vapor deposition (TCVD) grown single...
Contact potential, conduction current, and electrical contact resistance were measured in air and in...
CNTs can have the ability to act as compliant small-scale springs or as shock resistance micro-conta...
We report on a non-invasive contact probing (NICP) system for measuring the distribution of local su...
To realize carbon nanotube (CNT) as on-chip interconnect materials, the contact resistance stemming ...
The growth behaviors and contact resistances of vertically aligned carbon nanotubes (CNTs) and carbo...
We report on a non-invasive contact probing (NICP) system for measuring the distribution of local su...
ABSTRACT Recent studies and device demonstrations indicate that horizontally aligned arrays of linea...