Add to ORKGThe authors explore the intrinsic trade-off in a DRAM between the power consumption (due to refresh) and the reliability. Their unique measurement platform allows tailoring to the design constraints depending on whether power consumption, performance or reliability has the highest design priority. Furthermore, the authors show how this measurement platform can be used for reverse engineering the internal structure of DRAMs and how this knowledge can be used to improve DRAM’s reliability
In an extensively data-driven and technology-centric world, there has presently been a high demand f...
DRAM, the type of memory cell widely used for high density high speed system memory, faces uncertain...
Dynamic random access memories (DRAMs) are the most widely used type of memory in the market today, ...
DRAM vendors provide pessimistic current measures in memory datasheets to account for worst-case imp...
To head-off the trend of increasing power con-sumption and throughput overheads due to refresh in DR...
Aggressive process scaling and increasing demands of performance/cost efficiency have exacerbated th...
To address the needs of the next generation of low-power systems, DDR2 SDRAM offers a number of low-...
DRAM vendors provide pessimistic current measures in mem-ory datasheets to account for worst-case im...
Abstract—Variability in modern digital integrated circuits is emerging as an important area of resea...
Abstract—Technology scaling has led to significant variability in chip performance and power consump...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
Dynamic Random Access Memories (DRAM) are large complex devices, prone to defects during manufacture...
Several DRAM architectures exist with each differing in their performance, power and cost metrics. T...
DRAMs face several major challenges: On the one hand, DRAM bit cells are leaky and must be refreshed...
Abstract—Ever-growing application data footprints demand faster main memory with larger capacity. DR...
In an extensively data-driven and technology-centric world, there has presently been a high demand f...
DRAM, the type of memory cell widely used for high density high speed system memory, faces uncertain...
Dynamic random access memories (DRAMs) are the most widely used type of memory in the market today, ...
DRAM vendors provide pessimistic current measures in memory datasheets to account for worst-case imp...
To head-off the trend of increasing power con-sumption and throughput overheads due to refresh in DR...
Aggressive process scaling and increasing demands of performance/cost efficiency have exacerbated th...
To address the needs of the next generation of low-power systems, DDR2 SDRAM offers a number of low-...
DRAM vendors provide pessimistic current measures in mem-ory datasheets to account for worst-case im...
Abstract—Variability in modern digital integrated circuits is emerging as an important area of resea...
Abstract—Technology scaling has led to significant variability in chip performance and power consump...
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Compute...
Dynamic Random Access Memories (DRAM) are large complex devices, prone to defects during manufacture...
Several DRAM architectures exist with each differing in their performance, power and cost metrics. T...
DRAMs face several major challenges: On the one hand, DRAM bit cells are leaky and must be refreshed...
Abstract—Ever-growing application data footprints demand faster main memory with larger capacity. DR...
In an extensively data-driven and technology-centric world, there has presently been a high demand f...
DRAM, the type of memory cell widely used for high density high speed system memory, faces uncertain...
Dynamic random access memories (DRAMs) are the most widely used type of memory in the market today, ...