Fabrication of FinFETs using bulk CMOS instead of silicon on insulator (SOI) technology is of utmost interest as it reduces the process costs. Using well-calibrated device models and 3-D mixed mode simulations, we show that bulk FinFETs can be optimized with identical performances as that of SOI FinFETs. Optimized bulk FinFETs are compared with the corresponding SOI FinFETs for a range of technology nodes using an extensive simulation and design methodology. Further, we extend the concept of body doping in bulk FinFETs to the case of lightly doped fins unlike the heavily doped fin cases reported earlier. The optimum body doping required for bulk FinFETs, and its multiple advantages are also systematically evaluated. We also show that device...
This paper reports the first ESD results on NMOS and gated diode devices processed in a bulk FinFET ...
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling lea...
This paper reports the first ESD results on NMOS and gated diode devices processed in a bulk FinFET ...
Fabrication of FinFETs using bulk CMOS instead of silicon on insulator (SOI) technology is of utmost...
FinFETs are the leading candidates for sub 32nm technology node owing to their increased immunity to...
Abstract — The body-tied FinFETs (bulk FinFETs) implemented on bulk Si substrate were characterized ...
We present an insight into the parasitic capacitances of one of the most advanced silicon device ava...
A new body-on-insulator (BOI) FinFET device structure based on bulk-Si substrate has been proposed a...
Superior scalability and better gate-to-channel capacitive coupling can be achieved with adopting ga...
This paper describes the characteristics comparison of bulk FINFET and SOI FINFET. The scaling trend...
In recent years FinFET emerges as a promising device to assure the desired performance in the sub-22...
This study aims to understand the potential of bulk FinFET technology from the perspective of sub-an...
Thermal performance characteristics of fin-shaped FETs (FinFETs) are studied and analyzed in this pa...
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling lea...
This study aims to understand the potential of bulk FinFET technology from the perspective of sub- a...
This paper reports the first ESD results on NMOS and gated diode devices processed in a bulk FinFET ...
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling lea...
This paper reports the first ESD results on NMOS and gated diode devices processed in a bulk FinFET ...
Fabrication of FinFETs using bulk CMOS instead of silicon on insulator (SOI) technology is of utmost...
FinFETs are the leading candidates for sub 32nm technology node owing to their increased immunity to...
Abstract — The body-tied FinFETs (bulk FinFETs) implemented on bulk Si substrate were characterized ...
We present an insight into the parasitic capacitances of one of the most advanced silicon device ava...
A new body-on-insulator (BOI) FinFET device structure based on bulk-Si substrate has been proposed a...
Superior scalability and better gate-to-channel capacitive coupling can be achieved with adopting ga...
This paper describes the characteristics comparison of bulk FINFET and SOI FINFET. The scaling trend...
In recent years FinFET emerges as a promising device to assure the desired performance in the sub-22...
This study aims to understand the potential of bulk FinFET technology from the perspective of sub-an...
Thermal performance characteristics of fin-shaped FETs (FinFETs) are studied and analyzed in this pa...
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling lea...
This study aims to understand the potential of bulk FinFET technology from the perspective of sub- a...
This paper reports the first ESD results on NMOS and gated diode devices processed in a bulk FinFET ...
FinFET devices promise to replace traditional MOSFETs because of superior ability in controlling lea...
This paper reports the first ESD results on NMOS and gated diode devices processed in a bulk FinFET ...