Consideration was given to the problem of time verification of the combinational circuits, namely, to the problem of determining the false paths. The delays arising in the false paths do not manifest themselves in the circuit operational mode. At determination of the maximal circuit delay as a whole it is recommendable to detect and disregard such paths. It was proposed to reduce the problem of detecting a false path to the search of a test pattern for the stuck-at 0.1 faults of the character of the equivalent normal form corresponding to this path. Search of the test patterns comes to analyzing the conjunctions of the equivalent normal form represented compactly by the AND-OR trees and the structurally synthesized binary decision diagrams....
A novel path delay fault simulator for combinational logic circuits which is capable of detecting bo...
A novel path delay fault simulator for combinational logic circuits which is capable of detecting bo...
Nowadays, the digital circuit production is carried out specifying the circuit functionality using a...
Method of finding false paths in sequential circuits is developed. In contrast with heuristic approa...
[[abstract]]A novel approach to solving the false path problem is proposed. The approach is based on...
[[abstract]]A novel approach to solving the false path problem is proposed. The approach is based on...
[[abstract]]In this paper we present a new approach to solving the false path problem. The method is...
[[abstract]]In this paper, we introduce a formalism, called Timed Boolean Calculus (TBC), and its ap...
A number of tasks in computer-aided analysis of combinational circuits, including test pattern gener...
[[abstract]]In this paper we present a new approach to solving the false path problem. The method is...
[[abstract]]The method presented is based on previous work on timed Boolean calculus. Given a logic ...
This paper introduces a new class of false path, which is sensi-tizable but does not affect the deci...
The new test pattern generation system for path delay faults in combinational logic circuits conside...
111 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.A preliminary study of the re...
111 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.A preliminary study of the re...
A novel path delay fault simulator for combinational logic circuits which is capable of detecting bo...
A novel path delay fault simulator for combinational logic circuits which is capable of detecting bo...
Nowadays, the digital circuit production is carried out specifying the circuit functionality using a...
Method of finding false paths in sequential circuits is developed. In contrast with heuristic approa...
[[abstract]]A novel approach to solving the false path problem is proposed. The approach is based on...
[[abstract]]A novel approach to solving the false path problem is proposed. The approach is based on...
[[abstract]]In this paper we present a new approach to solving the false path problem. The method is...
[[abstract]]In this paper, we introduce a formalism, called Timed Boolean Calculus (TBC), and its ap...
A number of tasks in computer-aided analysis of combinational circuits, including test pattern gener...
[[abstract]]In this paper we present a new approach to solving the false path problem. The method is...
[[abstract]]The method presented is based on previous work on timed Boolean calculus. Given a logic ...
This paper introduces a new class of false path, which is sensi-tizable but does not affect the deci...
The new test pattern generation system for path delay faults in combinational logic circuits conside...
111 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.A preliminary study of the re...
111 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.A preliminary study of the re...
A novel path delay fault simulator for combinational logic circuits which is capable of detecting bo...
A novel path delay fault simulator for combinational logic circuits which is capable of detecting bo...
Nowadays, the digital circuit production is carried out specifying the circuit functionality using a...