This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how the VNA measurement noise performance is enhanced through implementation of a high-speed, broadband, active RF interferometer module. The presented VNA noise model provides a solid framework, benchmarked by measurement data, to analyze existing RF interferometer approaches. The performance improvement of the proposed interferometer implementation is then benchmarked in terms of magnitude and phase stability of the renormalized impedance level. A test bench employing the novel add-on RF interferometer module is presented and demonstrated to achieve high-speed cancellation of ...
Nano-scale devices and high power transistors present extreme impedances, which are far removed from...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Abstract—An improved version of the interferometric method to measure near-carrier AM and PM noise i...
This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VN...
Portable, accurate, and relatively inexpensive highfrequency vector network analyzers (VNAs) have gr...
The measurement of the close-to-the-carrier noise of rf and microwave devices is a relevant issue in...
On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differ...
Portable, accurate, and relatively inexpensive high-frequency vector network analyzers (VNAs) have g...
In this thesis several new advancements in the field of linear and non-linear vector network analysi...
This paper analyzes the measurement of ultra wideband (UWB) noise channels in different indoor envir...
In RF and microwave engineering, the vector network analyzers (VNAs) are commonly used for network a...
A frequency-domain method is proposed for the broadband measurement of error vector magnitude (EVM) ...
This article presents some of the most recent multiport VNA measurement methodologies used to chara...
An Overview of the most relevant issues concerning RF and microwave linear measurements is presented...
This paper presents low frequency noise (LFN) measurements of some commonly used microwave transisto...
Nano-scale devices and high power transistors present extreme impedances, which are far removed from...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Abstract—An improved version of the interferometric method to measure near-carrier AM and PM noise i...
This paper analyzes and accurately models the complex noise behavior of vector network analyzers (VN...
Portable, accurate, and relatively inexpensive highfrequency vector network analyzers (VNAs) have gr...
The measurement of the close-to-the-carrier noise of rf and microwave devices is a relevant issue in...
On-wafer measurement setups are introduced for measuring the noise figure and s-parameters of differ...
Portable, accurate, and relatively inexpensive high-frequency vector network analyzers (VNAs) have g...
In this thesis several new advancements in the field of linear and non-linear vector network analysi...
This paper analyzes the measurement of ultra wideband (UWB) noise channels in different indoor envir...
In RF and microwave engineering, the vector network analyzers (VNAs) are commonly used for network a...
A frequency-domain method is proposed for the broadband measurement of error vector magnitude (EVM) ...
This article presents some of the most recent multiport VNA measurement methodologies used to chara...
An Overview of the most relevant issues concerning RF and microwave linear measurements is presented...
This paper presents low frequency noise (LFN) measurements of some commonly used microwave transisto...
Nano-scale devices and high power transistors present extreme impedances, which are far removed from...
Vector network analysers (VNA) are used extensively for measurements that are made at frequencies ra...
Abstract—An improved version of the interferometric method to measure near-carrier AM and PM noise i...