We present a multiline Thru-Reflect-Line (TRL) calibration standard for Planar Goubau Line (PGL) which allows setting the calibration plane along the PGL and thus removing the effect of the embedding structure. This opens the possibility of characterizing PGL-circuits. The presented structures were used for calibrating S-parameters measurements between 0.75 THz and 1.1 THz to characterize a 1 mm long and 10 \ub5m wide PGL. The line shows negligible dispersion with an effective relative permittivity of 2.0 and an attenuation constant lower than 0.35 Np/mm (0.65 dB/λ)
A multiline Thru-Reflect-Line (mTRL) calibration and parasitic pad removal kit is presented, intende...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...
In many cases, metallic planar waveguides are required in the design of integrated circuits. However...
International audienceThis study presents the design, fabrication, and measurement of a square open-...
Terahertz-wave technology has a broad range of applications, including radio astronomy, telecommunic...
Abstract—Terahertz spectroscopy is a new tool for real time biological analysis. Unfortunately, inve...
Low-loss planar Goubau lines show promising potential for terahertz applications. However, a single-...
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardwa...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...
In this paper, we present a new technique for assessing the validity of the reference impedance in m...
International audiencePlanar Goubau Line (PGL) structures on high resistivity silicon are simulated ...
International audiencePlanar Goubau Line (PGL) structures on high resistivity silicon are simulated ...
The multimode thru-reflect-line (TRL) calibration technique is widely applied to characterizing diff...
A multiline Thru-Reflect-Line (mTRL) calibration and parasitic pad removal kit is presented, intende...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...
In many cases, metallic planar waveguides are required in the design of integrated circuits. However...
International audienceThis study presents the design, fabrication, and measurement of a square open-...
Terahertz-wave technology has a broad range of applications, including radio astronomy, telecommunic...
Abstract—Terahertz spectroscopy is a new tool for real time biological analysis. Unfortunately, inve...
Low-loss planar Goubau lines show promising potential for terahertz applications. However, a single-...
Scattering-parameters (S-parameters) are important to be evaluated in order to ascertain the hardwa...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...
In this paper, we present a new technique for assessing the validity of the reference impedance in m...
International audiencePlanar Goubau Line (PGL) structures on high resistivity silicon are simulated ...
International audiencePlanar Goubau Line (PGL) structures on high resistivity silicon are simulated ...
The multimode thru-reflect-line (TRL) calibration technique is widely applied to characterizing diff...
A multiline Thru-Reflect-Line (mTRL) calibration and parasitic pad removal kit is presented, intende...
Tremendous development in wireless mobile communication and microwave measurement increase the deman...
The quality of calibration standards in on-wafer measurements has a strong impact on the accuracy of...