Measuring the error sensitivity by fault injection is an important method for assessing the dependability of computer systems. In this paper, we define error sensitivity as the conditional probability that a hardware-related error causes a silent data corruption. When measuring the error sensitivity it is important to consider how the experimental setup and the workload characteristics affect the estimated error sensitivity. We consider five such potential sources of variation (PSVs) in this paper. Three of these are related to the workload: i) input profile, ii) source code implementation, and, iii) use of compiler optimization. Two are related to the experimental setup: i) single vs. double bit-flips, and ii) inject-on-read vs. inject-on-...
This paper presents an experimental study of the fault sensitivity of four programs included in the ...
Transient hardware faults caused by cosmic ray or alpha particle strikes in hardware components are ...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
Fault injection is an increasingly important method for assessing, measuringand observing the system...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Technology scaling is reducing the reliability of integrated circuits. This makes it important to pr...
In this paper we study the impact of compiler optimizations on the error sensitivity of twelve bench...
This paper presents the results of an extensive experimental study of bit-flip errors in instruction...
This paper presents the results of an extensive fault injection study of the impact of processor fau...
Abstract. The effects of variations in the workload input when estimating error detection coverage u...
International audienceSystem reliability has become a main concern during the computer-based system ...
Abstract—Technology constraints and application character-istics are radically changing as we scale ...
This paper investigates sources of uncertainty in measurement results obtained using three different...
Recent studies have shown that technology and voltage scaling are expected to increase the likelihoo...
This paper presents an experimental study of the fault sensitivity of four programs included in the ...
Transient hardware faults caused by cosmic ray or alpha particle strikes in hardware components are ...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...
This thesis addresses the problem of measuring hardware error sensitivity of computer systems. Hardw...
Fault injection is an increasingly important method for assessing, measuringand observing the system...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
Technology scaling is reducing the reliability of integrated circuits. This makes it important to pr...
In this paper we study the impact of compiler optimizations on the error sensitivity of twelve bench...
This paper presents the results of an extensive experimental study of bit-flip errors in instruction...
This paper presents the results of an extensive fault injection study of the impact of processor fau...
Abstract. The effects of variations in the workload input when estimating error detection coverage u...
International audienceSystem reliability has become a main concern during the computer-based system ...
Abstract—Technology constraints and application character-istics are radically changing as we scale ...
This paper investigates sources of uncertainty in measurement results obtained using three different...
Recent studies have shown that technology and voltage scaling are expected to increase the likelihoo...
This paper presents an experimental study of the fault sensitivity of four programs included in the ...
Transient hardware faults caused by cosmic ray or alpha particle strikes in hardware components are ...
Technology scaling of integrated circuits is making transistors increasingly sensitive to process va...