The thermal emission rates of electrons from InAs/GaAs quantum dots were measured, to found the capture cross sections in the extremely high region of 10-11-10-10 cm2. An additional method based on a static measurement at thermal equilibrium was used where the Fermi level was positioned at the free energy level of the quantum dot s shell. A Schottky diode with a plane of QDs grown in its depletion region and back-biased in such a way that the Fermi level coincides with the electron energy level. The Fermi level passes the lowest energy level of the QD, at the voltage marked by Vp in the graphs
We demonstrate the self-organized InAs quantum dots capped with thin and In0.2Al0.8As and In0.2Ga0.8...
Molecular beam epitaxy was employed to manufacture self-assembled InAs/GaAs quantum dot Schottky res...
Deep level transient spectroscopy (DLTS) technique was successfully applied to characterize the elec...
The thermal emission rates of electrons from InAs/GaAs quantum dots were measured, to found the capt...
A deep level transient spectroscopy technique has been used to determine the emission activation ene...
Tunneling emission rates of electrons from InAs quantum dots (QD) in a GaAs matrix depletion region ...
Photoluminescence, capacitance-voltage and transmission electron microscopy studies have been carrie...
The carrier trapping and emission processes of InAs self-assembled quantum dots (QDs) on GaAs substr...
InAs/GaAs quantum-dot heterostructures grown by molecular-beam epitaxy are studied using cross-secti...
We have investigated the temperature dependence of photoluminescence (PL) properties of a number of ...
InAs/GaAs quantum dot (QD) heterostructures grown by molecular beam epitaxy are studied using cross-...
Scanning transmission electron microscopy (STEM) and energy dispersive X-ray analysis (EDX) have bee...
The processes which control the occupation of quantum dot (QD) states have a major influence on the ...
Deep Level Transient Spectroscopy (DLTS) has been applied to investigate the electronic properties o...
Capacitance-voltage characteristics have been measured at various frequencies and temperatures for s...
We demonstrate the self-organized InAs quantum dots capped with thin and In0.2Al0.8As and In0.2Ga0.8...
Molecular beam epitaxy was employed to manufacture self-assembled InAs/GaAs quantum dot Schottky res...
Deep level transient spectroscopy (DLTS) technique was successfully applied to characterize the elec...
The thermal emission rates of electrons from InAs/GaAs quantum dots were measured, to found the capt...
A deep level transient spectroscopy technique has been used to determine the emission activation ene...
Tunneling emission rates of electrons from InAs quantum dots (QD) in a GaAs matrix depletion region ...
Photoluminescence, capacitance-voltage and transmission electron microscopy studies have been carrie...
The carrier trapping and emission processes of InAs self-assembled quantum dots (QDs) on GaAs substr...
InAs/GaAs quantum-dot heterostructures grown by molecular-beam epitaxy are studied using cross-secti...
We have investigated the temperature dependence of photoluminescence (PL) properties of a number of ...
InAs/GaAs quantum dot (QD) heterostructures grown by molecular beam epitaxy are studied using cross-...
Scanning transmission electron microscopy (STEM) and energy dispersive X-ray analysis (EDX) have bee...
The processes which control the occupation of quantum dot (QD) states have a major influence on the ...
Deep Level Transient Spectroscopy (DLTS) has been applied to investigate the electronic properties o...
Capacitance-voltage characteristics have been measured at various frequencies and temperatures for s...
We demonstrate the self-organized InAs quantum dots capped with thin and In0.2Al0.8As and In0.2Ga0.8...
Molecular beam epitaxy was employed to manufacture self-assembled InAs/GaAs quantum dot Schottky res...
Deep level transient spectroscopy (DLTS) technique was successfully applied to characterize the elec...