Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron behaviour in solids and calibrating the Chalmers Pulsed Positron Beam. Experiments are executed for positron energies up to 13 keV corresponding to the maximum penetration depth in Au of roughly 400 nm and measurement results are compared to PENELOPE simulations. Reference towards Makhov modelling is made. The future goal of the study is to investigate the depth dependence of ion-induced radiation damage where positrons will be used to characterise sizes and intensities of vacancy-type lattice defects
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
The objective of this paper is experimental studies of the linear absorption coefficient, or mean pe...
AbstractA slow-positron beam system for in-situ positron lifetime measurements during ion beam irrad...
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron lifetime measurements are made with the Chalmers Pulsed Positron Beam with the aim to inves...
Positron lifetime measurements are made with the Chalmers Pulsed Positron Beam with the aim to inves...
Positron Annihilation Lifetime Spectroscopy can be used to characterize radia- tion-induced material...
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: th...
The major aspect of this research is the development of a variable-energy PALS beamline based on a S...
Defect analysis is needed for samples ranging in thickness from thin films to large engineering part...
The study of the interaction of positron beams with solid targets was approached by several investig...
A new intense positron beam lifetime spectrometer is being developed at the Reactor Institute Delft ...
Abstract We briefly review the principles of the Doppler Broadening of the positron annihilation ra...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the f...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
The objective of this paper is experimental studies of the linear absorption coefficient, or mean pe...
AbstractA slow-positron beam system for in-situ positron lifetime measurements during ion beam irrad...
Positron lifetime measurements are used as a tool for obtaining a deeper understanding of positron b...
Positron lifetime measurements are made with the Chalmers Pulsed Positron Beam with the aim to inves...
Positron lifetime measurements are made with the Chalmers Pulsed Positron Beam with the aim to inves...
Positron Annihilation Lifetime Spectroscopy can be used to characterize radia- tion-induced material...
We are developing a defect analysis capability based on two positron beam lifetime spectrometers: th...
The major aspect of this research is the development of a variable-energy PALS beamline based on a S...
Defect analysis is needed for samples ranging in thickness from thin films to large engineering part...
The study of the interaction of positron beams with solid targets was approached by several investig...
A new intense positron beam lifetime spectrometer is being developed at the Reactor Institute Delft ...
Abstract We briefly review the principles of the Doppler Broadening of the positron annihilation ra...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
We are using a defect analysis capabilities based on two positron beam lifetime spectrometers: the f...
Positron lifetime spectroscopy is a powerful tool to identify vacancy type defects in semiconductor ...
The objective of this paper is experimental studies of the linear absorption coefficient, or mean pe...
AbstractA slow-positron beam system for in-situ positron lifetime measurements during ion beam irrad...