The key factor for competitiveness, in all industrial sectors, is to continuously enhance the quality of the products and the productivity. There are numerous ways to improve product quality, but necessary no one correct way to implement tasks that are needed. But in the essence of product quality is understanding the field conditions that the product will meet, and base the product testing accordingly. The internal testing methodology in Danfoss Vaasa site has been systematically devel-oped from the very beginning of Vacon frequency converter manufacturing and has been successfully implemented for many years. Still there is always room for improve-ment on testing productivity. Long time the development of reliability testing methods has l...
[[abstract]] 本文對8025直流無刷冷卻風扇產品,選定適合的組合性加嚴應力與建構適合的模式,規劃一系列實驗來了解其大小與使用壽限的變化關係,並於加速應力測試中獲得加速壽命測試模式的相關參數...
Work on reliability and life time estimation of new electronic components is an initial approach to ...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...
Trouble shooting and maximize the reliability of components are essential in creating a seamless pro...
Life consumption monitoring is a method to assess product's reliability based on its remaining life ...
There are a lot of different electronic circuits we use in everyday life. Each of them has their own...
There are a lot of different electronic circuits we use in everyday life. Each of them has their own...
Today's manufacturers need to develop newer, higher technology products in record time while im...
Reliability testing of electronics is performed to ensure that products function as planned in speci...
I declare that this thesis is my own, unaided work. It is being submitted for the Degree of Doctor o...
Thesis: M. Eng. in Advanced Manufacturing and Design, Massachusetts Institute of Technology, Departm...
Accelerated life tests are used to obtain quickly information about the failure time distribution of...
Reliability testing of electronics is performed to ensure that products function as planned in speci...
The integration of millions of transistors on a single chip is possible due to rapid scaling of CMOS...
Cost reduction and product quality are key factors in the present competitive market. Product reliab...
[[abstract]] 本文對8025直流無刷冷卻風扇產品,選定適合的組合性加嚴應力與建構適合的模式,規劃一系列實驗來了解其大小與使用壽限的變化關係,並於加速應力測試中獲得加速壽命測試模式的相關參數...
Work on reliability and life time estimation of new electronic components is an initial approach to ...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...
Trouble shooting and maximize the reliability of components are essential in creating a seamless pro...
Life consumption monitoring is a method to assess product's reliability based on its remaining life ...
There are a lot of different electronic circuits we use in everyday life. Each of them has their own...
There are a lot of different electronic circuits we use in everyday life. Each of them has their own...
Today's manufacturers need to develop newer, higher technology products in record time while im...
Reliability testing of electronics is performed to ensure that products function as planned in speci...
I declare that this thesis is my own, unaided work. It is being submitted for the Degree of Doctor o...
Thesis: M. Eng. in Advanced Manufacturing and Design, Massachusetts Institute of Technology, Departm...
Accelerated life tests are used to obtain quickly information about the failure time distribution of...
Reliability testing of electronics is performed to ensure that products function as planned in speci...
The integration of millions of transistors on a single chip is possible due to rapid scaling of CMOS...
Cost reduction and product quality are key factors in the present competitive market. Product reliab...
[[abstract]] 本文對8025直流無刷冷卻風扇產品,選定適合的組合性加嚴應力與建構適合的模式,規劃一系列實驗來了解其大小與使用壽限的變化關係,並於加速應力測試中獲得加速壽命測試模式的相關參數...
Work on reliability and life time estimation of new electronic components is an initial approach to ...
This project focuses on the possibilities of enhancing the accelerated life testing of semiconductor...