A single flange 2-port TRL calibration and measurement setup for accurate THz S-parameter characterization of integrated membrane circuit devices is proposed. The proposed setup facilitates shorter access waveguides, which greatly improves the calibration uncertainty
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
In this thesis a novel measurement setup and thru-reflect-line (TRL) calibration kit for vector netw...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
In this thesis a novel measurement setup and thru-reflect-line (TRL) calibration kit for vector netw...
We demonstrate S-parameter characterization of membrane circuits in the WR-03 frequency band (220-32...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
In this thesis, a thru-reflect-line (TRL) calibration technique enabling full S-parameter characteri...
We demonstrate S-parameter characterization of membrane circuits in the WR-03 frequency band (220-32...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
This paper describes a single flange 2-port measurement setup for S-parameter characterization of wa...
In this thesis a novel measurement setup and thru-reflect-line (TRL) calibration kit for vector netw...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
In this thesis a novel measurement setup and thru-reflect-line (TRL) calibration kit for vector netw...
We demonstrate S-parameter characterization of membrane circuits in the WR-03 frequency band (220-32...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
A TRL-calibration kit enabling S-parameter characterization of membrane circuits has been developed ...
In this thesis, a thru-reflect-line (TRL) calibration technique enabling full S-parameter characteri...
We demonstrate S-parameter characterization of membrane circuits in the WR-03 frequency band (220-32...
We present a sensitivity analysis on TRL calibrated S-parameter measurements of membrane circuits in...
The calibration and measurement problem at millimeter-wave frequencies of planar devices and MMICs i...
International audienceIn this paper, we present on-wafer S-parameter measurement of test structures ...