Thermally grown Al2O3 scales formed on a FeCrAl alloy were successfully analyzed using pulsed green laser atom probe tomography. Two types of atom probe tomography specimens, the “thin oxide” type: a thin Al2O3 layer
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
This review aims to describe and illustrate the advances in the application of atom probe tomography...
International audienceDue to the continuous miniaturisation of microelectronic devices, the developm...
Thermally grown Al2O3 scales formed on a FeCrAl alloy, Kanthal APMT, were successfully analysed usin...
Atom probe tomography, APT, is the only microstructural method that can routinely analyse and positi...
We employed correlative atom probe tomography (APT) and transmission electron microscopy (TEM) to an...
This study deploys a new method to gain insight into the as-quenched microstructure of Al–Mg–Si allo...
International audienceThe tomographic atom probe (TAP) has been used to analyse Guinier-Preston (GP)...
International audienceThe tomographic atom probe (TAP) has been used to analyse Guinier-Preston (GP)...
The present paper reviews recent progress in atomic-scale characterisation of composition and nanost...
International audienceThe tomographic atom probe (TAP) has been used to analyse Guinier-Preston (GP)...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
In microelectronics, the increase in complexity and the reduction of devices dimensions make essenti...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
This review aims to describe and illustrate the advances in the application of atom probe tomography...
International audienceDue to the continuous miniaturisation of microelectronic devices, the developm...
Thermally grown Al2O3 scales formed on a FeCrAl alloy, Kanthal APMT, were successfully analysed usin...
Atom probe tomography, APT, is the only microstructural method that can routinely analyse and positi...
We employed correlative atom probe tomography (APT) and transmission electron microscopy (TEM) to an...
This study deploys a new method to gain insight into the as-quenched microstructure of Al–Mg–Si allo...
International audienceThe tomographic atom probe (TAP) has been used to analyse Guinier-Preston (GP)...
International audienceThe tomographic atom probe (TAP) has been used to analyse Guinier-Preston (GP)...
The present paper reviews recent progress in atomic-scale characterisation of composition and nanost...
International audienceThe tomographic atom probe (TAP) has been used to analyse Guinier-Preston (GP)...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
In microelectronics, the increase in complexity and the reduction of devices dimensions make essenti...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
International audienceThe tomographic atom probe is a new instrument which enables a small volume of...
This review aims to describe and illustrate the advances in the application of atom probe tomography...
International audienceDue to the continuous miniaturisation of microelectronic devices, the developm...