Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Reijnders, M.P.
Geer, van der, S.B.
Taban, G.
Luiten, O.J.
Mutsaers, P.H.A.
Vredenbregt, E.J.D.
Charalambidis, D.
Farantos, S.
Lambroulos, P.

January 2007

Focused Ion Beams (FIB) are widely used in the semiconductor industry for milling, sputtering and im...

Effets d'une impulsion laser infra-rouge femtoseconde sur les micro-nanostructures des mineraux implications pour les analyses in-situ pa LA-ICP-MS

d' Abzac, François Xavier

November 2010

Infra Red femtosecond laser ablation coupled to Mass Spectrometry is a powerful tool for in-situ ana...

Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments

Nellen, Philipp M.
Callegari, Victor
Sennhauser, Urs

November 2006

Over the past 15 years, with materials research moving into sub-micrometer-dimensions, focused ion b...

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Bussoli, Marco
Batani, Dimitri
Desai, Tara
Canova, Federico
Milani, Marziale
Trtica, Milan
Gaković, Biljana M.
Krousky, Edouard

January 2007

We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analys...

Investigation on picosecond laser ablation of dental material using FIB/SEM techniques

Hussein A. Jawad

September 2016

Results of laser ablation for human tooth are reported based on detected images from Focused Ion Bea...

In situ monitoring of material processing by a pulsed laser beam coupled via a lensed fiber into a scanning electron microscope

Hwang, David J.
Misra, Nipun
Grigoropoulos, Costas P.
Minor, Andrew M.
Mao, Samuel S.

January 2008

In this study, a new method coupling laser irradiation into a dual-beam scanning electron microscope...

Advanced focused ion beam methods for prototyping and analytical applications

Neusser, Gregor

December 2018

Focused ion beam (FIB) and scanning electron microscopy (SEM) became indispensable tools for materia...

Focused ion beam scanning electron microscopy in biology.

Kizilyaprak, C.
Daraspe, J.
Humbel, B.M.

January 2014

Since the end of the last millennium, the focused ion beam scanning electron microscopy (FIB-SEM) ha...

Focused ion beam sample preparation for transmission elektron microscopy

Krajňák, Matúš

January 2011

In this work is studied preparation of specimen for transmission electron microscope (TEM). Scanning...

Efficient target preparation by combining laser ablation and FIB milling in a single tool

Stegmann, H.
Dömer, H.
Cai, H.
Rosenkranz, R.
Zschech, E.

January 2011

Analysis of samples from 3D integration, packaging and joining technologies more often than ever req...

In situ investigation of laser ablation

Lenk, A.
Witke, T.

January 1995

The complex system of in situ diagnostic methods such as SEM, ballistic microbalance, electric probe...

How to study biological samples by FIB/SEM?

Marziale Milani
Damjana Drobne
Francesco Tatti

March 2015

The focused ion beam (FIB)/scanning electron microscope (SEM) is a scanning microscope with an elect...

MP-4 Morphology and Formation of Craters Can be Investigated by a

August 2015

Laser ablation has many applications in industry e.g. for controlled laser machining. Another intere...

Materials response to glancing incidence femtosecond laser ablation

Echlin, M.P.
Titus, M.S.
Straw, M.
Gumbsch, P.
Pollock, T.M.

January 2017

A femtosecond Ti:sapphire laser was used to ablate samples of copper, strontium titanate (STO), a ni...

Focused ion beam in dental research

Ngo, H.
Cairney, J.
Vargas, M.
Mount, G.

January 2000

Focused ion beam (FIB) has been available for over 10 yrs but until recently its usage has been conf...

Laser-cooled ion source

Reijnders, M.P.
Geer, van der, S.B.
Taban, G.
Luiten, O.J.
Mutsaers, P.H.A.
Vredenbregt, E.J.D.
Charalambidis, D.
Farantos, S.
Lambroulos, P.

January 2007

Focused Ion Beams (FIB) are widely used in the semiconductor industry for milling, sputtering and im...

Effets d'une impulsion laser infra-rouge femtoseconde sur les micro-nanostructures des mineraux implications pour les analyses in-situ pa LA-ICP-MS

d' Abzac, François Xavier

November 2010

Infra Red femtosecond laser ablation coupled to Mass Spectrometry is a powerful tool for in-situ ana...

Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments

Nellen, Philipp M.
Callegari, Victor
Sennhauser, Urs

November 2006

Over the past 15 years, with materials research moving into sub-micrometer-dimensions, focused ion b...

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Bussoli, Marco
Batani, Dimitri
Desai, Tara
Canova, Federico
Milani, Marziale
Trtica, Milan
Gaković, Biljana M.
Krousky, Edouard

January 2007

We propose the use of Focused Ion Beam/Scanning Electron Microscope (FIB/SEM) devices for the analys...

Investigation on picosecond laser ablation of dental material using FIB/SEM techniques

Hussein A. Jawad

September 2016

Results of laser ablation for human tooth are reported based on detected images from Focused Ion Bea...

In situ monitoring of material processing by a pulsed laser beam coupled via a lensed fiber into a scanning electron microscope

Hwang, David J.
Misra, Nipun
Grigoropoulos, Costas P.
Minor, Andrew M.
Mao, Samuel S.

January 2008

In this study, a new method coupling laser irradiation into a dual-beam scanning electron microscope...

Advanced focused ion beam methods for prototyping and analytical applications

Neusser, Gregor

December 2018

Focused ion beam (FIB) and scanning electron microscopy (SEM) became indispensable tools for materia...

Focused ion beam scanning electron microscopy in biology.

Kizilyaprak, C.
Daraspe, J.
Humbel, B.M.

January 2014

Since the end of the last millennium, the focused ion beam scanning electron microscopy (FIB-SEM) ha...

Focused ion beam sample preparation for transmission elektron microscopy

Krajňák, Matúš

January 2011

In this work is studied preparation of specimen for transmission electron microscope (TEM). Scanning...

Efficient target preparation by combining laser ablation and FIB milling in a single tool

Stegmann, H.
Dömer, H.
Cai, H.
Rosenkranz, R.
Zschech, E.

January 2011

Analysis of samples from 3D integration, packaging and joining technologies more often than ever req...

In situ investigation of laser ablation

Lenk, A.
Witke, T.

January 1995

The complex system of in situ diagnostic methods such as SEM, ballistic microbalance, electric probe...

How to study biological samples by FIB/SEM?

Marziale Milani
Damjana Drobne
Francesco Tatti

March 2015

The focused ion beam (FIB)/scanning electron microscope (SEM) is a scanning microscope with an elect...

MP-4 Morphology and Formation of Craters Can be Investigated by a

August 2015

Laser ablation has many applications in industry e.g. for controlled laser machining. Another intere...

Materials response to glancing incidence femtosecond laser ablation

Echlin, M.P.
Titus, M.S.
Straw, M.
Gumbsch, P.
Pollock, T.M.

January 2017

A femtosecond Ti:sapphire laser was used to ablate samples of copper, strontium titanate (STO), a ni...

Focused ion beam in dental research

Ngo, H.
Cairney, J.
Vargas, M.
Mount, G.

January 2000

Focused ion beam (FIB) has been available for over 10 yrs but until recently its usage has been conf...

Laser-cooled ion source

Reijnders, M.P.
Geer, van der, S.B.
Taban, G.
Luiten, O.J.
Mutsaers, P.H.A.
Vredenbregt, E.J.D.
Charalambidis, D.
Farantos, S.
Lambroulos, P.

January 2007

Focused Ion Beams (FIB) are widely used in the semiconductor industry for milling, sputtering and im...

Effets d'une impulsion laser infra-rouge femtoseconde sur les micro-nanostructures des mineraux implications pour les analyses in-situ pa LA-ICP-MS

d' Abzac, François Xavier

November 2010

Infra Red femtosecond laser ablation coupled to Mass Spectrometry is a powerful tool for in-situ ana...

Preparative Methods for Nanoanalysis of Materials with Focused Ion Beam Instruments

Nellen, Philipp M.
Callegari, Victor
Sennhauser, Urs

November 2006

Over the past 15 years, with materials research moving into sub-micrometer-dimensions, focused ion b...

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Abstract

Extracted data

Study of laser induced ablation with focused ion beam/scanning electron microscope devices

Abstract

Extracted data

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