Measurement of the life-times distribution of Po-216

The life time distribution measurements of the alpha emitter Po-216 have been performed with semiconductor detectors. We applied a new method to obtain the distribution of time intervals between the correlated signals of decay of the Po-216. The deduced half-life of Po-216 was found to be 144.0(6) ms, supporting the earlier published measurements and with an uncertainty much lower than any other previously reported value. (C) 2017 Elsevier B.V. All rights reserved