Add to ORKGIn this paper a modified architecture for at-speed scan testing is presented. This new architecture addresses the trend in the semiconductor industry for increased at-speed structural testing. The proposed architecture offers reduced time for standard at-speed testing, and, in particular, substantial savings for the repeated atspeed testing required for microprocessor speed and performance binning. The architecture has been demonstrated on UMC 0.18μm and has achieved with little die overhead
Abstract—We propose a procedure for generating compact test sets with enhanced at-speed testing capa...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...
Abstract – In this paper a modified architecture for at-speed scan testing is presented. This new ar...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
Abstract- In this paper we will present an on-chip method for testing high performance memory device...
Abstract. We have introduced a low-cost at-speed BIST architecture that enables conventional micropr...
Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requi...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
Periodic on-chip scan-based tests have to be applied to a many-core processor to improve its dependa...
As technology down scaling continues, new technical challenges emerge for the Integrated Circuits (I...
Abstract—We propose a procedure for generating compact test sets with enhanced at-speed testing capa...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...
Abstract – In this paper a modified architecture for at-speed scan testing is presented. This new ar...
In this paper a modified architecture for at-speed scan testing is presented. This new architecture ...
This paper discusses the aspects and associated requirements of design and implementation of at-spee...
In this paper we will present an on-chip method for testing high performance memory devices, that oc...
Abstract- In this paper we will present an on-chip method for testing high performance memory device...
Abstract. We have introduced a low-cost at-speed BIST architecture that enables conventional micropr...
Today's System-on-a-Chip (SoC) is designed with reusable IP cores to meet short time-to-market requi...
With today’s design size in millions of gates and working frequency in gigahertz range, at-speed tes...
A test architecture for an SOC consists of a number of Test Access Mechanisms that connect to wrappe...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
Periodic on-chip scan-based tests have to be applied to a many-core processor to improve its dependa...
As technology down scaling continues, new technical challenges emerge for the Integrated Circuits (I...
Abstract—We propose a procedure for generating compact test sets with enhanced at-speed testing capa...
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at ...
We propose a new design for testability technique, Parallel Serial Full Scan (PSFS), for reducing th...