In addition to a conventional phase a the interference signal of a sinusoidal-wavelength-scanning interferometer has a phase-modulation amplitude Zb that is proportional to the optical path difference L and amplitude b of the wavelength scan. L and b are controlled by a double feedback system so that the phase alpha and the amplitude Zb are kept at 3pi/2 and pi, respectively. The voltage applied to a device that displaces a reference mirror to change the optical path difference becomes a ruler with scales smaller than a wavelength. Voltage applied to a device that determines the amplitude of the wavelength scan becomes a ruler marking every wavelength. These two rulers enable one to measure an absolute distance longer than a wavelength in r...
An interferometric range finder that uses both phase-locked and modulation-amplitude-locked techniqu...
Laser interferometry 9 : International conferences : Jul 1998, San Diego, CAIn sinusoidal phase-modu...
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 200...
19th congress of the international commission for optics : optics for the quality of life : 25-30 Au...
The optical path difference (OPD) and amplitude of a sinusoidal wavelength scanning (SWS) are contro...
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. : Oct ...
A linear CCD image sensor is used to electrically scan a measuring point and measure 1-D step-profil...
Sinusoidal phase-modulating interferometry is used to detect exactly the sinusoidal phase variation ...
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. : Oct ...
Applications : Conference : Sep 1999, Pultusk, PolandTwo different sinusoidal wavelength-scanning (S...
A new type of two-wavelength interferometer which applies a phase-lock technique is described. The w...
A new range-finding technique that uses both double sinusoidal phase modulation and quasi-two-wavele...
In sinusoidal phase-modulating interferometry an optical path length (OPD) larger than a wavelength ...
We describe a two-wavelength laser-diode interferometer that is insensitive to external disturbances...
A two-wavelength interferometer that uses two separate modulating currents with different phases but...
An interferometric range finder that uses both phase-locked and modulation-amplitude-locked techniqu...
Laser interferometry 9 : International conferences : Jul 1998, San Diego, CAIn sinusoidal phase-modu...
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 200...
19th congress of the international commission for optics : optics for the quality of life : 25-30 Au...
The optical path difference (OPD) and amplitude of a sinusoidal wavelength scanning (SWS) are contro...
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. : Oct ...
A linear CCD image sensor is used to electrically scan a measuring point and measure 1-D step-profil...
Sinusoidal phase-modulating interferometry is used to detect exactly the sinusoidal phase variation ...
Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. : Oct ...
Applications : Conference : Sep 1999, Pultusk, PolandTwo different sinusoidal wavelength-scanning (S...
A new type of two-wavelength interferometer which applies a phase-lock technique is described. The w...
A new range-finding technique that uses both double sinusoidal phase modulation and quasi-two-wavele...
In sinusoidal phase-modulating interferometry an optical path length (OPD) larger than a wavelength ...
We describe a two-wavelength laser-diode interferometer that is insensitive to external disturbances...
A two-wavelength interferometer that uses two separate modulating currents with different phases but...
An interferometric range finder that uses both phase-locked and modulation-amplitude-locked techniqu...
Laser interferometry 9 : International conferences : Jul 1998, San Diego, CAIn sinusoidal phase-modu...
Two- and three-dimensional vision systems for inspection, control, and metrology : 29-30 October 200...