Early detection of defects in metallic components used in infrastructure is crucial to ensure their safety and reliability. This paper presents a development of a small eddy current testing (ECT) probe for evaluation of sub-millimetre surface defects. The ECT probe is developed in a planar differential using sensitive anisotropy magnetoresistance sensors, and the signal amplification is achieved by a home-made instrumentation amplifier. The developed ECT probe is evaluated by performing phase sensitive measurement of the magnetic responses of sub-millimetre surface slits at the excitation field of 200 Hz and 10 kHz. Compared to the real component of the magnetic response, the imaginary component can be used to identify the existence and pos...
Magnetic flux leakage (MFL) and eddy current testing (ECT) are two of the most commonly used techniq...
Magnetic Flux Leakage (MFL) and Eddy Current Testing (ECT) are commonly employed as the non-destruct...
The detection of surface cracks at or close to sample edges is a challenging problem because the int...
Early detection of defects in metallic components used in infrastructure is crucial to e...
Detecting defects in high-permeability steel components can be challenging when using the eddy curre...
This study performs an analysis of a small eddy current probe config-uration based on differential a...
Eddy current testing (ECT) is a technique that is used to identify deficiencies and faulty in metall...
The present work deals with developing a high-sensitive electromagnetic probe for non-destructive te...
The article describes a hardware and software complex designed for defectoscopy and study of materia...
Objectives: Non-Destructive Evaluation (NDE) is the inspection of an object to determine its propert...
Defects such as cracks can cause dangerous damage to the metal structure and may lead to structural ...
Eddy current testing is one of the most widely Non Destructive Evaluation (NDE) methods which utiliz...
The eddy current testing (ECT) is used to inspect a material to determine its properties without des...
The most crucial components in the eddy current system are the sensitivity of the eddy current probe...
Non-Destructive Test (NDT) techniques are widely used in several industries since nowadays most of t...
Magnetic flux leakage (MFL) and eddy current testing (ECT) are two of the most commonly used techniq...
Magnetic Flux Leakage (MFL) and Eddy Current Testing (ECT) are commonly employed as the non-destruct...
The detection of surface cracks at or close to sample edges is a challenging problem because the int...
Early detection of defects in metallic components used in infrastructure is crucial to e...
Detecting defects in high-permeability steel components can be challenging when using the eddy curre...
This study performs an analysis of a small eddy current probe config-uration based on differential a...
Eddy current testing (ECT) is a technique that is used to identify deficiencies and faulty in metall...
The present work deals with developing a high-sensitive electromagnetic probe for non-destructive te...
The article describes a hardware and software complex designed for defectoscopy and study of materia...
Objectives: Non-Destructive Evaluation (NDE) is the inspection of an object to determine its propert...
Defects such as cracks can cause dangerous damage to the metal structure and may lead to structural ...
Eddy current testing is one of the most widely Non Destructive Evaluation (NDE) methods which utiliz...
The eddy current testing (ECT) is used to inspect a material to determine its properties without des...
The most crucial components in the eddy current system are the sensitivity of the eddy current probe...
Non-Destructive Test (NDT) techniques are widely used in several industries since nowadays most of t...
Magnetic flux leakage (MFL) and eddy current testing (ECT) are two of the most commonly used techniq...
Magnetic Flux Leakage (MFL) and Eddy Current Testing (ECT) are commonly employed as the non-destruct...
The detection of surface cracks at or close to sample edges is a challenging problem because the int...